Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
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Filing date
Publication date
Application filed by Agency of Industrial Science and TechnologyfiledCriticalAgency of Industrial Science and Technology
Priority to JP13820375ApriorityCriticalpatent/JPS5262459A/en
Publication of JPS5262459ApublicationCriticalpatent/JPS5262459A/en
Testing Or Measuring Of Semiconductors Or The Like
(AREA)
Measurement Of Resistance Or Impedance
(AREA)
Abstract
PURPOSE: To enable measurement without error in measuring Hall mobility by a current applied to the measured object, voltage between two points along the current and the Hallwoltage when magnetic field is applied to the object to be measured, by applying rotating magnetic field with apermanent magnet attached to the rotating body.
COPYRIGHT: (C)1977,JPO&Japio
JP13820375A1975-11-191975-11-19Measuring device for hall mobility by rotating magnet
PendingJPS5262459A
(en)