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Hitachi Ltd
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Hitachi Ltd
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Application filed by Hitachi LtdfiledCriticalHitachi Ltd
Priority to JP50116489ApriorityCriticalpatent/JPS5241576A/en
Publication of JPS5241576ApublicationCriticalpatent/JPS5241576A/en
Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves
(AREA)
Abstract
PURPOSE: In an ultrasonic probe used in a section indicating ultrasonic flaw detection apparatus, a device which is small in size and permits easy swing adjustment is obtained.