JPS5233782A - Single crystal x-ray diffraction device - Google Patents

Single crystal x-ray diffraction device

Info

Publication number
JPS5233782A
JPS5233782A JP50109488A JP10948875A JPS5233782A JP S5233782 A JPS5233782 A JP S5233782A JP 50109488 A JP50109488 A JP 50109488A JP 10948875 A JP10948875 A JP 10948875A JP S5233782 A JPS5233782 A JP S5233782A
Authority
JP
Japan
Prior art keywords
single crystal
ray diffraction
diffraction device
ray detectors
obtianed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP50109488A
Other languages
English (en)
Japanese (ja)
Other versions
JPS547586B2 (show.php
Inventor
Ukyo Kaminaga
Akira Yamada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RIGAKU DENKI KK
Rigaku Denki Co Ltd
Original Assignee
RIGAKU DENKI KK
Rigaku Denki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by RIGAKU DENKI KK, Rigaku Denki Co Ltd filed Critical RIGAKU DENKI KK
Priority to JP50109488A priority Critical patent/JPS5233782A/ja
Publication of JPS5233782A publication Critical patent/JPS5233782A/ja
Publication of JPS547586B2 publication Critical patent/JPS547586B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP50109488A 1975-09-11 1975-09-11 Single crystal x-ray diffraction device Granted JPS5233782A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50109488A JPS5233782A (en) 1975-09-11 1975-09-11 Single crystal x-ray diffraction device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50109488A JPS5233782A (en) 1975-09-11 1975-09-11 Single crystal x-ray diffraction device

Publications (2)

Publication Number Publication Date
JPS5233782A true JPS5233782A (en) 1977-03-15
JPS547586B2 JPS547586B2 (show.php) 1979-04-07

Family

ID=14511506

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50109488A Granted JPS5233782A (en) 1975-09-11 1975-09-11 Single crystal x-ray diffraction device

Country Status (1)

Country Link
JP (1) JPS5233782A (show.php)

Also Published As

Publication number Publication date
JPS547586B2 (show.php) 1979-04-07

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