JPS5229671Y1 - - Google Patents

Info

Publication number
JPS5229671Y1
JPS5229671Y1 JP3158775U JP3158775U JPS5229671Y1 JP S5229671 Y1 JPS5229671 Y1 JP S5229671Y1 JP 3158775 U JP3158775 U JP 3158775U JP 3158775 U JP3158775 U JP 3158775U JP S5229671 Y1 JPS5229671 Y1 JP S5229671Y1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP3158775U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3158775U priority Critical patent/JPS5229671Y1/ja
Publication of JPS5229671Y1 publication Critical patent/JPS5229671Y1/ja
Expired legal-status Critical Current

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Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
JP3158775U 1975-03-06 1975-03-06 Expired JPS5229671Y1 (en17)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3158775U JPS5229671Y1 (en17) 1975-03-06 1975-03-06

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3158775U JPS5229671Y1 (en17) 1975-03-06 1975-03-06

Publications (1)

Publication Number Publication Date
JPS5229671Y1 true JPS5229671Y1 (en17) 1977-07-06

Family

ID=33051542

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3158775U Expired JPS5229671Y1 (en17) 1975-03-06 1975-03-06

Country Status (1)

Country Link
JP (1) JPS5229671Y1 (en17)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014013203A (ja) * 2012-07-04 2014-01-23 Kanazawa Univ X線応力測定方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014013203A (ja) * 2012-07-04 2014-01-23 Kanazawa Univ X線応力測定方法

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