JPS5223224B2 - - Google Patents
Info
- Publication number
- JPS5223224B2 JPS5223224B2 JP1545574A JP1545574A JPS5223224B2 JP S5223224 B2 JPS5223224 B2 JP S5223224B2 JP 1545574 A JP1545574 A JP 1545574A JP 1545574 A JP1545574 A JP 1545574A JP S5223224 B2 JPS5223224 B2 JP S5223224B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1545574A JPS5223224B2 (ja�@�@) | 1974-02-08 | 1974-02-08 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1545574A JPS5223224B2 (ja�@�@) | 1974-02-08 | 1974-02-08 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS50110577A JPS50110577A (ja�@�@) | 1975-08-30 |
| JPS5223224B2 true JPS5223224B2 (ja�@�@) | 1977-06-22 |
Family
ID=11889265
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1545574A Expired JPS5223224B2 (ja�@�@) | 1974-02-08 | 1974-02-08 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5223224B2 (ja�@�@) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7973543B2 (en) * | 2008-07-11 | 2011-07-05 | Advantest Corporation | Measurement apparatus, test apparatus and measurement method |
| JP6026386B2 (ja) * | 2013-11-05 | 2016-11-16 | エスペック株式会社 | 外部短絡試験装置及び外部短絡試験方法 |
-
1974
- 1974-02-08 JP JP1545574A patent/JPS5223224B2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS50110577A (ja�@�@) | 1975-08-30 |