JPS5223224B2 - - Google Patents

Info

Publication number
JPS5223224B2
JPS5223224B2 JP1545574A JP1545574A JPS5223224B2 JP S5223224 B2 JPS5223224 B2 JP S5223224B2 JP 1545574 A JP1545574 A JP 1545574A JP 1545574 A JP1545574 A JP 1545574A JP S5223224 B2 JPS5223224 B2 JP S5223224B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1545574A
Other languages
Japanese (ja)
Other versions
JPS50110577A (cg-RX-API-DMAC7.html
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1545574A priority Critical patent/JPS5223224B2/ja
Publication of JPS50110577A publication Critical patent/JPS50110577A/ja
Publication of JPS5223224B2 publication Critical patent/JPS5223224B2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP1545574A 1974-02-08 1974-02-08 Expired JPS5223224B2 (cg-RX-API-DMAC7.html)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1545574A JPS5223224B2 (cg-RX-API-DMAC7.html) 1974-02-08 1974-02-08

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1545574A JPS5223224B2 (cg-RX-API-DMAC7.html) 1974-02-08 1974-02-08

Publications (2)

Publication Number Publication Date
JPS50110577A JPS50110577A (cg-RX-API-DMAC7.html) 1975-08-30
JPS5223224B2 true JPS5223224B2 (cg-RX-API-DMAC7.html) 1977-06-22

Family

ID=11889265

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1545574A Expired JPS5223224B2 (cg-RX-API-DMAC7.html) 1974-02-08 1974-02-08

Country Status (1)

Country Link
JP (1) JPS5223224B2 (cg-RX-API-DMAC7.html)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7973543B2 (en) * 2008-07-11 2011-07-05 Advantest Corporation Measurement apparatus, test apparatus and measurement method
JP6026386B2 (ja) * 2013-11-05 2016-11-16 エスペック株式会社 外部短絡試験装置及び外部短絡試験方法

Also Published As

Publication number Publication date
JPS50110577A (cg-RX-API-DMAC7.html) 1975-08-30

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