JPS5220234B2 - - Google Patents

Info

Publication number
JPS5220234B2
JPS5220234B2 JP48054152A JP5415273A JPS5220234B2 JP S5220234 B2 JPS5220234 B2 JP S5220234B2 JP 48054152 A JP48054152 A JP 48054152A JP 5415273 A JP5415273 A JP 5415273A JP S5220234 B2 JPS5220234 B2 JP S5220234B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP48054152A
Other languages
Japanese (ja)
Other versions
JPS4943580A (en:Method
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS4943580A publication Critical patent/JPS4943580A/ja
Publication of JPS5220234B2 publication Critical patent/JPS5220234B2/ja
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2607Circuits therefor
    • G01R31/2632Circuits therefor for testing diodes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP48054152A 1972-05-19 1973-05-17 Expired JPS5220234B2 (en:Method)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2224632A DE2224632C3 (de) 1972-05-19 1972-05-19 Verfahren zur automatischen Selektion von Halbleiterbauelementen mit durch Sperrspannungsbelastung bedingter Sperrstromdrift

Publications (2)

Publication Number Publication Date
JPS4943580A JPS4943580A (en:Method) 1974-04-24
JPS5220234B2 true JPS5220234B2 (en:Method) 1977-06-02

Family

ID=5845425

Family Applications (1)

Application Number Title Priority Date Filing Date
JP48054152A Expired JPS5220234B2 (en:Method) 1972-05-19 1973-05-17

Country Status (2)

Country Link
JP (1) JPS5220234B2 (en:Method)
DE (1) DE2224632C3 (en:Method)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5044225Y1 (en:Method) * 1970-06-26 1975-12-17
JPS5044227Y1 (en:Method) * 1970-06-26 1975-12-17
JPS5044226Y1 (en:Method) * 1970-06-26 1975-12-17

Also Published As

Publication number Publication date
DE2224632A1 (de) 1973-11-29
JPS4943580A (en:Method) 1974-04-24
DE2224632C3 (de) 1979-09-06
DE2224632B2 (de) 1979-01-11

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