JPS52155926A - Test method for ic memory - Google Patents

Test method for ic memory

Info

Publication number
JPS52155926A
JPS52155926A JP7215376A JP7215376A JPS52155926A JP S52155926 A JPS52155926 A JP S52155926A JP 7215376 A JP7215376 A JP 7215376A JP 7215376 A JP7215376 A JP 7215376A JP S52155926 A JPS52155926 A JP S52155926A
Authority
JP
Japan
Prior art keywords
memory
test method
thru
provision
reliability
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7215376A
Other languages
Japanese (ja)
Other versions
JPS6055920B2 (en
Inventor
Takeo Uchiyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP51072153A priority Critical patent/JPS6055920B2/en
Publication of JPS52155926A publication Critical patent/JPS52155926A/en
Publication of JPS6055920B2 publication Critical patent/JPS6055920B2/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/24—Memory cell safety or protection circuits, e.g. arrangements for preventing inadvertent reading or writing; Status cells; Test cells

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Static Random-Access Memory (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE:To improve the reliability, by detecting the defective function due to the phase difference among a plural number of input terminals, thru the provision of the exclusive logical sum gate with the output of IC memory tester.
JP51072153A 1976-06-21 1976-06-21 IC memory test method Expired JPS6055920B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP51072153A JPS6055920B2 (en) 1976-06-21 1976-06-21 IC memory test method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP51072153A JPS6055920B2 (en) 1976-06-21 1976-06-21 IC memory test method

Publications (2)

Publication Number Publication Date
JPS52155926A true JPS52155926A (en) 1977-12-24
JPS6055920B2 JPS6055920B2 (en) 1985-12-07

Family

ID=13481017

Family Applications (1)

Application Number Title Priority Date Filing Date
JP51072153A Expired JPS6055920B2 (en) 1976-06-21 1976-06-21 IC memory test method

Country Status (1)

Country Link
JP (1) JPS6055920B2 (en)

Also Published As

Publication number Publication date
JPS6055920B2 (en) 1985-12-07

Similar Documents

Publication Publication Date Title
SE7614724L (en) DIRECT AGGLUTINATION TEST FOR PREGNANCY
JPS5363961A (en) Semiconductor integrated circuit
JPS52155926A (en) Test method for ic memory
DE3681666D1 (en) INTEGRATED SEMICONDUCTOR MEMORY.
JPS52112243A (en) Error detection system for exclusive reading memory
JPS5293361A (en) Automatic tester
JPS5348637A (en) Error detection method for program
JPS5322489A (en) Tension tester
JPS53118327A (en) Automatic test data generator
JPS52104968A (en) Circuit for electronic clock
JPS5333539A (en) Memory test unit
JPS538534A (en) Checking system for coincidence detection circuit
JPS5373041A (en) Detection device for fixed memory error
JPS5313477A (en) Operating time measuring system for mechanism
JPS5357715A (en) Testin device for memory device
JPS5216936A (en) Inspection method for semi-conductor memory element
JPS5261443A (en) Test method of semiconductor memory element
JPS5374814A (en) Construction work test method
JPS5365610A (en) Checking device for output level
JPS5250128A (en) Semiconductor test equipment
JPS5383431A (en) Test method for terminal unit
JPS545632A (en) Test method for memory unit
JPS52140246A (en) Information processing unit
JPS5375741A (en) Test equipment for data processing unit
JPS5310277A (en) Testing method of semiconductor elements