JPS52149184A - Flaw detector using hall elements for magnetic substances - Google Patents
Flaw detector using hall elements for magnetic substancesInfo
- Publication number
- JPS52149184A JPS52149184A JP6565476A JP6565476A JPS52149184A JP S52149184 A JPS52149184 A JP S52149184A JP 6565476 A JP6565476 A JP 6565476A JP 6565476 A JP6565476 A JP 6565476A JP S52149184 A JPS52149184 A JP S52149184A
- Authority
- JP
- Japan
- Prior art keywords
- hall elements
- flaw detector
- magnetic substances
- substances
- magnetic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6565476A JPS52149184A (en) | 1976-06-07 | 1976-06-07 | Flaw detector using hall elements for magnetic substances |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6565476A JPS52149184A (en) | 1976-06-07 | 1976-06-07 | Flaw detector using hall elements for magnetic substances |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS52149184A true JPS52149184A (en) | 1977-12-12 |
Family
ID=13293199
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6565476A Pending JPS52149184A (en) | 1976-06-07 | 1976-06-07 | Flaw detector using hall elements for magnetic substances |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS52149184A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62108150A (en) * | 1985-11-06 | 1987-05-19 | Shigeru Kitagawa | Method and device for detecting minute crack |
WO2019107575A1 (en) * | 2017-12-01 | 2019-06-06 | 住友化学株式会社 | Defect measurement device, defect measurement method, and inspection probe |
-
1976
- 1976-06-07 JP JP6565476A patent/JPS52149184A/en active Pending
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62108150A (en) * | 1985-11-06 | 1987-05-19 | Shigeru Kitagawa | Method and device for detecting minute crack |
WO2019107575A1 (en) * | 2017-12-01 | 2019-06-06 | 住友化学株式会社 | Defect measurement device, defect measurement method, and inspection probe |
JP2019100850A (en) * | 2017-12-01 | 2019-06-24 | 住友化学株式会社 | Defect measuring apparatus, defect measuring method, and inspection probe |
CN111417851A (en) * | 2017-12-01 | 2020-07-14 | 住友化学株式会社 | Defect measuring device, defect measuring method, and inspection probe |
KR20200092354A (en) * | 2017-12-01 | 2020-08-03 | 스미또모 가가꾸 가부시키가이샤 | Defect measurement device, defect measurement method and inspection probe |
EP3719490A4 (en) * | 2017-12-01 | 2021-09-01 | Sumitomo Chemical Company Limited | Defect measurement device, defect measurement method, and inspection probe |
US11821870B2 (en) | 2017-12-01 | 2023-11-21 | Sumitomo Chemical Company, Limited | Defect measurement device, defect measurement method, and inspection probe |
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