JPS52147489A - Method and device for analysis by wavelength diffusionntype xxray spectrometer - Google Patents
Method and device for analysis by wavelength diffusionntype xxray spectrometerInfo
- Publication number
- JPS52147489A JPS52147489A JP6424976A JP6424976A JPS52147489A JP S52147489 A JPS52147489 A JP S52147489A JP 6424976 A JP6424976 A JP 6424976A JP 6424976 A JP6424976 A JP 6424976A JP S52147489 A JPS52147489 A JP S52147489A
- Authority
- JP
- Japan
- Prior art keywords
- diffusionntype
- xxray
- spectrometer
- wavelength
- analysis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6424976A JPS52147489A (en) | 1976-06-02 | 1976-06-02 | Method and device for analysis by wavelength diffusionntype xxray spectrometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6424976A JPS52147489A (en) | 1976-06-02 | 1976-06-02 | Method and device for analysis by wavelength diffusionntype xxray spectrometer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS52147489A true JPS52147489A (en) | 1977-12-07 |
Family
ID=13252683
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6424976A Pending JPS52147489A (en) | 1976-06-02 | 1976-06-02 | Method and device for analysis by wavelength diffusionntype xxray spectrometer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS52147489A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55129737A (en) * | 1979-03-30 | 1980-10-07 | Jeol Ltd | Analysis method by x-ray spectrometer |
JP2020098156A (en) * | 2018-12-18 | 2020-06-25 | 日本電子株式会社 | Calibration method and analyzer |
-
1976
- 1976-06-02 JP JP6424976A patent/JPS52147489A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55129737A (en) * | 1979-03-30 | 1980-10-07 | Jeol Ltd | Analysis method by x-ray spectrometer |
JP2020098156A (en) * | 2018-12-18 | 2020-06-25 | 日本電子株式会社 | Calibration method and analyzer |
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