JPS52144765A - Line balancing coil - Google Patents
Line balancing coilInfo
- Publication number
- JPS52144765A JPS52144765A JP6095376A JP6095376A JPS52144765A JP S52144765 A JPS52144765 A JP S52144765A JP 6095376 A JP6095376 A JP 6095376A JP 6095376 A JP6095376 A JP 6095376A JP S52144765 A JPS52144765 A JP S52144765A
- Authority
- JP
- Japan
- Prior art keywords
- line balancing
- balancing coil
- coil
- line
- balancing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Cable Transmission Systems, Equalization Of Radio And Reduction Of Echo (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6095376A JPS52144765A (en) | 1976-05-26 | 1976-05-26 | Line balancing coil |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6095376A JPS52144765A (en) | 1976-05-26 | 1976-05-26 | Line balancing coil |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS52144765A true JPS52144765A (en) | 1977-12-02 |
Family
ID=13157255
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6095376A Pending JPS52144765A (en) | 1976-05-26 | 1976-05-26 | Line balancing coil |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS52144765A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008026321A (en) * | 2006-07-20 | 2008-02-07 | Microinspection Inc | Noncontact single side probe, and apparatus and method for testing breakage of wire and short circuit of conductive line for using the same |
-
1976
- 1976-05-26 JP JP6095376A patent/JPS52144765A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008026321A (en) * | 2006-07-20 | 2008-02-07 | Microinspection Inc | Noncontact single side probe, and apparatus and method for testing breakage of wire and short circuit of conductive line for using the same |
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