JPS52141683A - Abstracting apparatus of subject information - Google Patents

Abstracting apparatus of subject information

Info

Publication number
JPS52141683A
JPS52141683A JP5856376A JP5856376A JPS52141683A JP S52141683 A JPS52141683 A JP S52141683A JP 5856376 A JP5856376 A JP 5856376A JP 5856376 A JP5856376 A JP 5856376A JP S52141683 A JPS52141683 A JP S52141683A
Authority
JP
Japan
Prior art keywords
subject information
abstracting
abstracting apparatus
subject
developing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5856376A
Other languages
Japanese (ja)
Inventor
Atsumichi Murakami
Nobuhiro Nakamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP5856376A priority Critical patent/JPS52141683A/en
Publication of JPS52141683A publication Critical patent/JPS52141683A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)

Abstract

PURPOSE:To selectively abstract the optional spectrum component with a high accuracy and simple construction, by partially abstracting the light from the subject, separating into its spectral components and developing and arranging in the space.
JP5856376A 1976-05-20 1976-05-20 Abstracting apparatus of subject information Pending JPS52141683A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5856376A JPS52141683A (en) 1976-05-20 1976-05-20 Abstracting apparatus of subject information

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5856376A JPS52141683A (en) 1976-05-20 1976-05-20 Abstracting apparatus of subject information

Publications (1)

Publication Number Publication Date
JPS52141683A true JPS52141683A (en) 1977-11-26

Family

ID=13087912

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5856376A Pending JPS52141683A (en) 1976-05-20 1976-05-20 Abstracting apparatus of subject information

Country Status (1)

Country Link
JP (1) JPS52141683A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58115332A (en) * 1981-12-29 1983-07-09 Shimadzu Corp Two-wavelength photometric device
JPH02245716A (en) * 1989-02-14 1990-10-01 Microscan Imaging & Instrumentation Inc Quantative opticl microscope using solid detector and object scanning method using the same
WO2005033794A1 (en) * 2003-10-09 2005-04-14 Sony Corporation Image processing system and image processing method, image pickup device and method, and image display device and method
JP2006119152A (en) * 2000-08-08 2006-05-11 Carl Zeiss Jena Gmbh Method and device for grasping wavelength-dependent characteristic of illuminated sample

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58115332A (en) * 1981-12-29 1983-07-09 Shimadzu Corp Two-wavelength photometric device
JPH02245716A (en) * 1989-02-14 1990-10-01 Microscan Imaging & Instrumentation Inc Quantative opticl microscope using solid detector and object scanning method using the same
JP2006119152A (en) * 2000-08-08 2006-05-11 Carl Zeiss Jena Gmbh Method and device for grasping wavelength-dependent characteristic of illuminated sample
JP4509940B2 (en) * 2000-08-08 2010-07-21 カール ツァイス イエナ ゲゼルシャフト ミット ベシュレンクテル ハフツング Method and apparatus for determining wavelength dependent characteristics of illuminated samples
WO2005033794A1 (en) * 2003-10-09 2005-04-14 Sony Corporation Image processing system and image processing method, image pickup device and method, and image display device and method
US7724298B2 (en) 2003-10-09 2010-05-25 Sony Corporation Image processing system and method for pick up and display of an object including division of an optical image of the object into a spectrum

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