JPS52117040A - Integrating circuit function test unit - Google Patents

Integrating circuit function test unit

Info

Publication number
JPS52117040A
JPS52117040A JP3394676A JP3394676A JPS52117040A JP S52117040 A JPS52117040 A JP S52117040A JP 3394676 A JP3394676 A JP 3394676A JP 3394676 A JP3394676 A JP 3394676A JP S52117040 A JPS52117040 A JP S52117040A
Authority
JP
Japan
Prior art keywords
integrating circuit
test unit
function test
circuit function
shorten
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3394676A
Other languages
Japanese (ja)
Other versions
JPS6037902B2 (en
Inventor
Sumitoshi Shirasaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP51033946A priority Critical patent/JPS6037902B2/en
Publication of JPS52117040A publication Critical patent/JPS52117040A/en
Publication of JPS6037902B2 publication Critical patent/JPS6037902B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE: To shorten the time required for test by reducing pattern transfer volume to 1/3 W 1/2 of the usual with the integrating circuit test unit improved to provide the buffer memory divided into the pin block of plural pin units.
COPYRIGHT: (C)1977,JPO&Japio
JP51033946A 1976-03-27 1976-03-27 Integrated circuit functional testing equipment Expired JPS6037902B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP51033946A JPS6037902B2 (en) 1976-03-27 1976-03-27 Integrated circuit functional testing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP51033946A JPS6037902B2 (en) 1976-03-27 1976-03-27 Integrated circuit functional testing equipment

Publications (2)

Publication Number Publication Date
JPS52117040A true JPS52117040A (en) 1977-10-01
JPS6037902B2 JPS6037902B2 (en) 1985-08-29

Family

ID=12400664

Family Applications (1)

Application Number Title Priority Date Filing Date
JP51033946A Expired JPS6037902B2 (en) 1976-03-27 1976-03-27 Integrated circuit functional testing equipment

Country Status (1)

Country Link
JP (1) JPS6037902B2 (en)

Also Published As

Publication number Publication date
JPS6037902B2 (en) 1985-08-29

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