JPS52113773U - - Google Patents

Info

Publication number
JPS52113773U
JPS52113773U JP2803277U JP2803277U JPS52113773U JP S52113773 U JPS52113773 U JP S52113773U JP 2803277 U JP2803277 U JP 2803277U JP 2803277 U JP2803277 U JP 2803277U JP S52113773 U JPS52113773 U JP S52113773U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2803277U
Other languages
Japanese (ja)
Other versions
JPS5333504Y2 (enExample
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1977028032U priority Critical patent/JPS5333504Y2/ja
Publication of JPS52113773U publication Critical patent/JPS52113773U/ja
Application granted granted Critical
Publication of JPS5333504Y2 publication Critical patent/JPS5333504Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1977028032U 1977-03-10 1977-03-10 Expired JPS5333504Y2 (enExample)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1977028032U JPS5333504Y2 (enExample) 1977-03-10 1977-03-10

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1977028032U JPS5333504Y2 (enExample) 1977-03-10 1977-03-10

Publications (2)

Publication Number Publication Date
JPS52113773U true JPS52113773U (enExample) 1977-08-29
JPS5333504Y2 JPS5333504Y2 (enExample) 1978-08-17

Family

ID=28487718

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1977028032U Expired JPS5333504Y2 (enExample) 1977-03-10 1977-03-10

Country Status (1)

Country Link
JP (1) JPS5333504Y2 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0459146U (enExample) * 1990-09-28 1992-05-21
JPH0459144U (enExample) * 1990-09-28 1992-05-21

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3445770A (en) * 1965-12-27 1969-05-20 Philco Ford Corp Microelectronic test probe with defect marker access
US3508151A (en) * 1966-04-18 1970-04-21 Sprague Electric Co Card type probe head having knob anchored contacting ends

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3445770A (en) * 1965-12-27 1969-05-20 Philco Ford Corp Microelectronic test probe with defect marker access
US3508151A (en) * 1966-04-18 1970-04-21 Sprague Electric Co Card type probe head having knob anchored contacting ends

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0459146U (enExample) * 1990-09-28 1992-05-21
JPH0459144U (enExample) * 1990-09-28 1992-05-21

Also Published As

Publication number Publication date
JPS5333504Y2 (enExample) 1978-08-17

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