JPS52106246A - Test method - Google Patents

Test method

Info

Publication number
JPS52106246A
JPS52106246A JP2342376A JP2342376A JPS52106246A JP S52106246 A JPS52106246 A JP S52106246A JP 2342376 A JP2342376 A JP 2342376A JP 2342376 A JP2342376 A JP 2342376A JP S52106246 A JPS52106246 A JP S52106246A
Authority
JP
Japan
Prior art keywords
test method
auxiliary
communication circuit
unit
equips
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2342376A
Other languages
Japanese (ja)
Other versions
JPS563702B2 (en
Inventor
Katsuyuki Miyazaki
Shigehiko Matsushita
Shizuka Kubota
Kiichiro Ito
Shuhei Arima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Hitachi Ltd
NEC Corp
Nippon Telegraph and Telephone Corp
Oki Electric Industry Co Ltd
Original Assignee
Fujitsu Ltd
Hitachi Ltd
NEC Corp
Nippon Telegraph and Telephone Corp
Oki Electric Industry Co Ltd
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd, Hitachi Ltd, NEC Corp, Nippon Telegraph and Telephone Corp, Oki Electric Industry Co Ltd, Nippon Electric Co Ltd filed Critical Fujitsu Ltd
Priority to JP2342376A priority Critical patent/JPS52106246A/en
Publication of JPS52106246A publication Critical patent/JPS52106246A/en
Publication of JPS563702B2 publication Critical patent/JPS563702B2/ja
Granted legal-status Critical Current

Links

Abstract

PURPOSE: To establish the access route from auxiliary system to using system for the information process system which equips duplicated communication circuit of using and auxiliary systems and individual circuit corresponding to the communication circuit. Thus, the unit of auxiliary system can be utilized for a test unit.
COPYRIGHT: (C)1977,JPO&Japio
JP2342376A 1976-03-04 1976-03-04 Test method Granted JPS52106246A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2342376A JPS52106246A (en) 1976-03-04 1976-03-04 Test method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2342376A JPS52106246A (en) 1976-03-04 1976-03-04 Test method

Publications (2)

Publication Number Publication Date
JPS52106246A true JPS52106246A (en) 1977-09-06
JPS563702B2 JPS563702B2 (en) 1981-01-27

Family

ID=12110081

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2342376A Granted JPS52106246A (en) 1976-03-04 1976-03-04 Test method

Country Status (1)

Country Link
JP (1) JPS52106246A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07123030A (en) * 1993-10-27 1995-05-12 Nec Corp Fault diagnostic device
JP2010506326A (en) * 2006-10-11 2010-02-25 サムスン エスディーエス シーオー．エルティディ． Performance test system and method in integrated external channel environment

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07123030A (en) * 1993-10-27 1995-05-12 Nec Corp Fault diagnostic device
JP2010506326A (en) * 2006-10-11 2010-02-25 サムスン エスディーエス シーオー．エルティディ． Performance test system and method in integrated external channel environment
US8463907B2 (en) 2006-10-11 2013-06-11 Samsung Sds Co., Ltd. System and method for performance test in outside channel combination environment

Also Published As

Publication number Publication date
JPS563702B2 (en) 1981-01-27

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