JPS5187955A - - Google Patents
Info
- Publication number
- JPS5187955A JPS5187955A JP50012496A JP1249675A JPS5187955A JP S5187955 A JPS5187955 A JP S5187955A JP 50012496 A JP50012496 A JP 50012496A JP 1249675 A JP1249675 A JP 1249675A JP S5187955 A JPS5187955 A JP S5187955A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50012496A JPS5187955A (cs) | 1975-01-31 | 1975-01-31 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50012496A JPS5187955A (cs) | 1975-01-31 | 1975-01-31 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5187955A true JPS5187955A (cs) | 1976-07-31 |
Family
ID=11806971
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP50012496A Pending JPS5187955A (cs) | 1975-01-31 | 1975-01-31 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5187955A (cs) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0196958A2 (en) | 1985-03-15 | 1986-10-08 | Schlumberger Technologies, Inc. | Electron beam test probe for integrated-circuit testing |
-
1975
- 1975-01-31 JP JP50012496A patent/JPS5187955A/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0196958A2 (en) | 1985-03-15 | 1986-10-08 | Schlumberger Technologies, Inc. | Electron beam test probe for integrated-circuit testing |