JPS5174484U - - Google Patents
Info
- Publication number
- JPS5174484U JPS5174484U JP14957674U JP14957674U JPS5174484U JP S5174484 U JPS5174484 U JP S5174484U JP 14957674 U JP14957674 U JP 14957674U JP 14957674 U JP14957674 U JP 14957674U JP S5174484 U JPS5174484 U JP S5174484U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1974149576U JPS5646299Y2 (https=) | 1974-12-09 | 1974-12-09 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1974149576U JPS5646299Y2 (https=) | 1974-12-09 | 1974-12-09 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5174484U true JPS5174484U (https=) | 1976-06-11 |
| JPS5646299Y2 JPS5646299Y2 (https=) | 1981-10-29 |
Family
ID=28441341
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1974149576U Expired JPS5646299Y2 (https=) | 1974-12-09 | 1974-12-09 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5646299Y2 (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014241264A (ja) * | 2013-06-12 | 2014-12-25 | 富士通株式会社 | 二次イオン質量分析装置及び方法、並びにプログラム |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4966396A (https=) * | 1972-10-30 | 1974-06-27 |
-
1974
- 1974-12-09 JP JP1974149576U patent/JPS5646299Y2/ja not_active Expired
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4966396A (https=) * | 1972-10-30 | 1974-06-27 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014241264A (ja) * | 2013-06-12 | 2014-12-25 | 富士通株式会社 | 二次イオン質量分析装置及び方法、並びにプログラム |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5646299Y2 (https=) | 1981-10-29 |