JPS5146719B2 - - Google Patents

Info

Publication number
JPS5146719B2
JPS5146719B2 JP6535972A JP6535972A JPS5146719B2 JP S5146719 B2 JPS5146719 B2 JP S5146719B2 JP 6535972 A JP6535972 A JP 6535972A JP 6535972 A JP6535972 A JP 6535972A JP S5146719 B2 JPS5146719 B2 JP S5146719B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP6535972A
Other languages
Japanese (ja)
Other versions
JPS4925951A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6535972A priority Critical patent/JPS5146719B2/ja
Priority to US372694A priority patent/US3869211A/en
Priority to DE2333326A priority patent/DE2333326C3/en
Publication of JPS4925951A publication Critical patent/JPS4925951A/ja
Publication of JPS5146719B2 publication Critical patent/JPS5146719B2/ja
Expired legal-status Critical Current

Links

JP6535972A 1972-06-29 1972-06-29 Expired JPS5146719B2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP6535972A JPS5146719B2 (en) 1972-06-29 1972-06-29
US372694A US3869211A (en) 1972-06-29 1973-06-22 Instrument for measuring thickness of thin film
DE2333326A DE2333326C3 (en) 1972-06-29 1973-06-29 Device for measuring the thickness of a thin film deposited on a support

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6535972A JPS5146719B2 (en) 1972-06-29 1972-06-29

Publications (2)

Publication Number Publication Date
JPS4925951A JPS4925951A (en) 1974-03-07
JPS5146719B2 true JPS5146719B2 (en) 1976-12-10

Family

ID=13284672

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6535972A Expired JPS5146719B2 (en) 1972-06-29 1972-06-29

Country Status (1)

Country Link
JP (1) JPS5146719B2 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51145333A (en) * 1975-06-09 1976-12-14 Shuzo Hattori Manufacturing method of multi-layer dielectric film reflector
JPS5852475A (en) * 1981-09-24 1983-03-28 Ulvac Corp Method and device for monitoring and measuring thin film in thin film former
LT2489659T (en) * 2004-06-24 2018-03-26 Vertex Pharmaceuticals Incorporated Modulators of ATP-binding cassette transporters
EP2816317A4 (en) * 2012-02-15 2015-10-14 Shincron Co Ltd Optical film thickness measurement apparatus and thin-film forming apparatus using optical film thickness measurement apparatus

Also Published As

Publication number Publication date
JPS4925951A (en) 1974-03-07

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