JPS514427B1 - - Google Patents
Info
- Publication number
- JPS514427B1 JPS514427B1 JP45002114A JP211470A JPS514427B1 JP S514427 B1 JPS514427 B1 JP S514427B1 JP 45002114 A JP45002114 A JP 45002114A JP 211470 A JP211470 A JP 211470A JP S514427 B1 JPS514427 B1 JP S514427B1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B21—MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
- B21B—ROLLING OF METAL
- B21B37/00—Control devices or methods specially adapted for metal-rolling mills or the work produced thereby
- B21B37/16—Control of thickness, width, diameter or other transverse dimensions
- B21B37/165—Control of thickness, width, diameter or other transverse dimensions responsive mainly to the measured thickness of the product
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B21—MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
- B21B—ROLLING OF METAL
- B21B38/00—Methods or devices for measuring, detecting or monitoring specially adapted for metal-rolling mills, e.g. position detection, inspection of the product
- B21B38/04—Methods or devices for measuring, detecting or monitoring specially adapted for metal-rolling mills, e.g. position detection, inspection of the product for measuring thickness, width, diameter or other transverse dimensions of the product
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/16—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Engineering & Computer Science (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Mechanical Engineering (AREA)
- Toxicology (AREA)
- Electromagnetism (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Control Of Metal Rolling (AREA)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP45002114A JPS514427B1 (OSRAM) | 1970-01-07 | 1970-01-07 | |
| US102356A US3670568A (en) | 1970-01-07 | 1970-12-29 | System of measuring the distribution of reduction rate of metal strips |
| SE7017842A SE384457B (sv) | 1970-01-07 | 1970-12-31 | Anordning for metning av tjockleksminskningen vid valsning av en metallremsa |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP45002114A JPS514427B1 (OSRAM) | 1970-01-07 | 1970-01-07 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS514427B1 true JPS514427B1 (OSRAM) | 1976-02-12 |
Family
ID=11520310
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP45002114A Pending JPS514427B1 (OSRAM) | 1970-01-07 | 1970-01-07 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US3670568A (OSRAM) |
| JP (1) | JPS514427B1 (OSRAM) |
| SE (1) | SE384457B (OSRAM) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54103938U (OSRAM) * | 1977-12-28 | 1979-07-21 |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4476717A (en) * | 1981-05-22 | 1984-10-16 | Murphy Richard F | Scanning gauge apparatus |
| GB2109924B (en) * | 1981-11-25 | 1985-02-06 | Schlumberger Electronics | Apparatus and method for measuring temperature profile |
| US4811582A (en) * | 1987-12-21 | 1989-03-14 | Aluminum Company Of America | Strain rate control of superplastic forming |
| US5388341A (en) * | 1993-08-04 | 1995-02-14 | Data Measurement Corporation | Virtual two gauge profile system |
| DE102006034244A1 (de) | 2006-07-21 | 2008-01-31 | Schott Ag | Verfahren und Vorrichtung zur Dickenmessung großflächiger Glassubstrate |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3442104A (en) * | 1965-01-30 | 1969-05-06 | Sumito Metal Ind Ltd | Controlling method and measuring instrument for the flatness of strips |
| US3474668A (en) * | 1967-10-12 | 1969-10-28 | Bethlehem Steel Corp | Noncontacting gauges for automatically measuring the profile of moving strip |
-
1970
- 1970-01-07 JP JP45002114A patent/JPS514427B1/ja active Pending
- 1970-12-29 US US102356A patent/US3670568A/en not_active Expired - Lifetime
- 1970-12-31 SE SE7017842A patent/SE384457B/xx unknown
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54103938U (OSRAM) * | 1977-12-28 | 1979-07-21 |
Also Published As
| Publication number | Publication date |
|---|---|
| US3670568A (en) | 1972-06-20 |
| SE384457B (sv) | 1976-05-10 |