JPS5134782A - X senbunkoki - Google Patents
X senbunkokiInfo
- Publication number
- JPS5134782A JPS5134782A JP49106696A JP10669674A JPS5134782A JP S5134782 A JPS5134782 A JP S5134782A JP 49106696 A JP49106696 A JP 49106696A JP 10669674 A JP10669674 A JP 10669674A JP S5134782 A JPS5134782 A JP S5134782A
- Authority
- JP
- Japan
- Prior art keywords
- senbunkoki
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP49106696A JPS5134782A (en) | 1974-09-18 | 1974-09-18 | X senbunkoki |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP49106696A JPS5134782A (en) | 1974-09-18 | 1974-09-18 | X senbunkoki |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5134782A true JPS5134782A (en) | 1976-03-24 |
Family
ID=14440179
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP49106696A Pending JPS5134782A (en) | 1974-09-18 | 1974-09-18 | X senbunkoki |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5134782A (ja) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3514599A (en) * | 1967-02-16 | 1970-05-26 | Cambridge Instr Co Ltd | Electron probe microanalyzer having a plurality of x-ray spectrometers positioned to minimize x-ray defocussing during specimen scanning |
-
1974
- 1974-09-18 JP JP49106696A patent/JPS5134782A/ja active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3514599A (en) * | 1967-02-16 | 1970-05-26 | Cambridge Instr Co Ltd | Electron probe microanalyzer having a plurality of x-ray spectrometers positioned to minimize x-ray defocussing during specimen scanning |
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