JPS5132277B1 - - Google Patents

Info

Publication number
JPS5132277B1
JPS5132277B1 JP45068721A JP6872170A JPS5132277B1 JP S5132277 B1 JPS5132277 B1 JP S5132277B1 JP 45068721 A JP45068721 A JP 45068721A JP 6872170 A JP6872170 A JP 6872170A JP S5132277 B1 JPS5132277 B1 JP S5132277B1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP45068721A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS5132277B1 publication Critical patent/JPS5132277B1/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2837—Characterising or performance testing, e.g. of frequency response
JP45068721A 1969-08-11 1970-08-07 Pending JPS5132277B1 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US84880269A 1969-08-11 1969-08-11

Publications (1)

Publication Number Publication Date
JPS5132277B1 true JPS5132277B1 (ja) 1976-09-11

Family

ID=25304310

Family Applications (1)

Application Number Title Priority Date Filing Date
JP45068721A Pending JPS5132277B1 (ja) 1969-08-11 1970-08-07

Country Status (4)

Country Link
US (1) US3585500A (ja)
JP (1) JPS5132277B1 (ja)
DE (1) DE2036751A1 (ja)
FR (1) FR2060093B1 (ja)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3694632A (en) * 1969-12-31 1972-09-26 Hawker Siddeley Dynamics Ltd Automatic test equipment utilizing a matrix of digital differential analyzer integrators to generate interrogation signals
NL7005372A (ja) * 1970-04-15 1971-10-19
DE2729422C2 (de) * 1977-06-29 1982-06-24 Endress U. Hauser Gmbh U. Co, 7867 Maulburg Schaltungsanordnung zur Impulsbreitenmessung
US4247817A (en) * 1978-05-15 1981-01-27 Teradyne, Inc. Transmitting electrical signals with a transmission time independent of distance between transmitter and receiver
US4465971A (en) * 1982-03-15 1984-08-14 Rca Corporation Circuit for coupling signals to or from a circuit under test
US4908576A (en) * 1987-09-08 1990-03-13 Jackson Daniel K System for printed circuit board testing
US4905056A (en) * 1988-09-30 1990-02-27 Berndt Dale F Superlattice precision voltage reference
US5194818A (en) * 1991-02-27 1993-03-16 National Semiconductor Corporation Risetime and falltime test system and method
US5339028A (en) * 1992-07-23 1994-08-16 Texas Instruments Incorporated Test circuit for screening parts
US5543728A (en) * 1993-06-15 1996-08-06 Grace; James W. Low leakage diode switches for a tester circuit for integrated circuits
JPH10332782A (ja) * 1997-05-30 1998-12-18 Ando Electric Co Ltd Ｉｃテストシステム
US6912202B1 (en) * 2001-01-25 2005-06-28 Advanced Micro Device, Inc. Arrangement for testing network switch expansion port using external logic to emulate connected expansion port
DE10219916A1 (de) * 2002-05-03 2003-12-04 Infineon Technologies Ag Testanordnung mit Testautomat und integriertem Schaltkreis sowie Verfahren zur Ermittlung des Zeitverhaltens eines integrierten Schaltkreises

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3359491A (en) * 1962-06-15 1967-12-19 Tektronix Inc Signal waveform characteristic measuring system having stop-start logic circuit
US3423677A (en) * 1965-12-07 1969-01-21 Texas Instruments Inc Test system for automatically making static and dynamic tests on an electronic device

Also Published As

Publication number Publication date
FR2060093B1 (ja) 1976-03-05
US3585500A (en) 1971-06-15
DE2036751A1 (de) 1971-04-29
FR2060093A1 (ja) 1971-06-11

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