JPS5121305B1 - - Google Patents

Info

Publication number
JPS5121305B1
JPS5121305B1 JP45110983A JP11098370A JPS5121305B1 JP S5121305 B1 JPS5121305 B1 JP S5121305B1 JP 45110983 A JP45110983 A JP 45110983A JP 11098370 A JP11098370 A JP 11098370A JP S5121305 B1 JPS5121305 B1 JP S5121305B1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP45110983A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP45110983A priority Critical patent/JPS5121305B1/ja
Publication of JPS5121305B1 publication Critical patent/JPS5121305B1/ja
Pending legal-status Critical Current

Links

JP45110983A 1970-12-10 1970-12-10 Pending JPS5121305B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP45110983A JPS5121305B1 (en) 1970-12-10 1970-12-10

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP45110983A JPS5121305B1 (en) 1970-12-10 1970-12-10

Publications (1)

Publication Number Publication Date
JPS5121305B1 true JPS5121305B1 (en) 1976-07-01

Family

ID=14549414

Family Applications (1)

Application Number Title Priority Date Filing Date
JP45110983A Pending JPS5121305B1 (en) 1970-12-10 1970-12-10

Country Status (1)

Country Link
JP (1) JPS5121305B1 (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3039604A (en) * 1959-09-10 1962-06-19 Texas Instruments Inc Centralized automatic tester for semiconductor units

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3039604A (en) * 1959-09-10 1962-06-19 Texas Instruments Inc Centralized automatic tester for semiconductor units

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