JPS5120255B2 - - Google Patents
Info
- Publication number
- JPS5120255B2 JPS5120255B2 JP11541272A JP11541272A JPS5120255B2 JP S5120255 B2 JPS5120255 B2 JP S5120255B2 JP 11541272 A JP11541272 A JP 11541272A JP 11541272 A JP11541272 A JP 11541272A JP S5120255 B2 JPS5120255 B2 JP S5120255B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Tests Of Electronic Circuits (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11541272A JPS5120255B2 (en:Method) | 1972-11-17 | 1972-11-17 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11541272A JPS5120255B2 (en:Method) | 1972-11-17 | 1972-11-17 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4974484A JPS4974484A (en:Method) | 1974-07-18 |
| JPS5120255B2 true JPS5120255B2 (en:Method) | 1976-06-23 |
Family
ID=14661915
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11541272A Expired JPS5120255B2 (en:Method) | 1972-11-17 | 1972-11-17 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5120255B2 (en:Method) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58150839U (ja) * | 1983-02-07 | 1983-10-08 | 富士通株式会社 | 電子ビ−ムを用いた測定装置 |
-
1972
- 1972-11-17 JP JP11541272A patent/JPS5120255B2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS4974484A (en:Method) | 1974-07-18 |