JPS5119790B2 - - Google Patents
Info
- Publication number
- JPS5119790B2 JPS5119790B2 JP46083294A JP8329471A JPS5119790B2 JP S5119790 B2 JPS5119790 B2 JP S5119790B2 JP 46083294 A JP46083294 A JP 46083294A JP 8329471 A JP8329471 A JP 8329471A JP S5119790 B2 JPS5119790 B2 JP S5119790B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP46083294A JPS5119790B2 (en) | 1971-10-22 | 1971-10-22 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP46083294A JPS5119790B2 (en) | 1971-10-22 | 1971-10-22 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4849473A JPS4849473A (en) | 1973-07-12 |
| JPS5119790B2 true JPS5119790B2 (en) | 1976-06-19 |
Family
ID=13798360
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP46083294A Expired JPS5119790B2 (en) | 1971-10-22 | 1971-10-22 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5119790B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2577525Y2 (en) * | 1989-12-23 | 1998-07-30 | 株式会社 住友金属セラミックス | Short / open inspection equipment |
-
1971
- 1971-10-22 JP JP46083294A patent/JPS5119790B2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS4849473A (en) | 1973-07-12 |