JPS5116861A - DENSHIKEN BIKYO - Google Patents

DENSHIKEN BIKYO

Info

Publication number
JPS5116861A
JPS5116861A JP8804174A JP8804174A JPS5116861A JP S5116861 A JPS5116861 A JP S5116861A JP 8804174 A JP8804174 A JP 8804174A JP 8804174 A JP8804174 A JP 8804174A JP S5116861 A JPS5116861 A JP S5116861A
Authority
JP
Japan
Prior art keywords
denshiken
bikyo
denshiken bikyo
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8804174A
Other languages
Japanese (ja)
Inventor
Shigeto Sunakozawa
Shinjiro Katagiri
Moriki Kubozoe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP8804174A priority Critical patent/JPS5116861A/en
Publication of JPS5116861A publication Critical patent/JPS5116861A/en
Pending legal-status Critical Current

Links

JP8804174A 1974-08-02 1974-08-02 DENSHIKEN BIKYO Pending JPS5116861A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8804174A JPS5116861A (en) 1974-08-02 1974-08-02 DENSHIKEN BIKYO

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8804174A JPS5116861A (en) 1974-08-02 1974-08-02 DENSHIKEN BIKYO

Publications (1)

Publication Number Publication Date
JPS5116861A true JPS5116861A (en) 1976-02-10

Family

ID=13931730

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8804174A Pending JPS5116861A (en) 1974-08-02 1974-08-02 DENSHIKEN BIKYO

Country Status (1)

Country Link
JP (1) JPS5116861A (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5143388A (en) * 1974-10-09 1976-04-14 Kuraray Co
JPS55166638U (en) * 1979-05-17 1980-12-01
JPS5686741A (en) * 1979-12-17 1981-07-14 Kanebo Ltd Coating material for agriculture
JPS59156743A (en) * 1983-02-24 1984-09-06 ユニチカ株式会社 Air-permeable heat-insulating material
JPH01101335U (en) * 1987-12-28 1989-07-07
JPH01155749U (en) * 1988-04-18 1989-10-26
JPH05153868A (en) * 1991-12-03 1993-06-22 Kanebo Ltd Covering material for thermal insulation and its production
US6987265B2 (en) 1997-08-07 2006-01-17 Hitachi, Ltd. Method and an apparatus of an inspection system using an electron beam

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5143388A (en) * 1974-10-09 1976-04-14 Kuraray Co
JPS6140712B2 (en) * 1974-10-09 1986-09-10 Kuraray Co
JPS55166638U (en) * 1979-05-17 1980-12-01
JPS5686741A (en) * 1979-12-17 1981-07-14 Kanebo Ltd Coating material for agriculture
JPS59156743A (en) * 1983-02-24 1984-09-06 ユニチカ株式会社 Air-permeable heat-insulating material
JPH01101335U (en) * 1987-12-28 1989-07-07
JPH01155749U (en) * 1988-04-18 1989-10-26
JPH05153868A (en) * 1991-12-03 1993-06-22 Kanebo Ltd Covering material for thermal insulation and its production
US6987265B2 (en) 1997-08-07 2006-01-17 Hitachi, Ltd. Method and an apparatus of an inspection system using an electron beam
US7012252B2 (en) 1997-08-07 2006-03-14 Hitachi, Ltd. Method and an apparatus of an inspection system using an electron beam
US7232996B2 (en) 1997-08-07 2007-06-19 Hitachi, Ltd. Method and an apparatus of an inspection system using an electron beam
US7439506B2 (en) 1997-08-07 2008-10-21 Hitachi, Ltd. Method and an apparatus of an inspection system using an electron beam
US8134125B2 (en) 1997-08-07 2012-03-13 Hitachi, Ltd. Method and apparatus of an inspection system using an electron beam
US8604430B2 (en) 1997-08-07 2013-12-10 Hitachi, Ltd. Method and an apparatus of an inspection system using an electron beam

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