JPS51150249A - Center frequency measuring method for celamic filter - Google Patents

Center frequency measuring method for celamic filter

Info

Publication number
JPS51150249A
JPS51150249A JP7378075A JP7378075A JPS51150249A JP S51150249 A JPS51150249 A JP S51150249A JP 7378075 A JP7378075 A JP 7378075A JP 7378075 A JP7378075 A JP 7378075A JP S51150249 A JPS51150249 A JP S51150249A
Authority
JP
Japan
Prior art keywords
celamic
filter
measuring method
center frequency
frequency measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7378075A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5634826B2 (en:Method
Inventor
Seisuke Hirakuri
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Victor Company of Japan Ltd
Original Assignee
Victor Company of Japan Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Victor Company of Japan Ltd filed Critical Victor Company of Japan Ltd
Priority to JP7378075A priority Critical patent/JPS51150249A/ja
Publication of JPS51150249A publication Critical patent/JPS51150249A/ja
Publication of JPS5634826B2 publication Critical patent/JPS5634826B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • G01R31/2824—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits testing of oscillators or resonators

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
JP7378075A 1975-06-19 1975-06-19 Center frequency measuring method for celamic filter Granted JPS51150249A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7378075A JPS51150249A (en) 1975-06-19 1975-06-19 Center frequency measuring method for celamic filter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7378075A JPS51150249A (en) 1975-06-19 1975-06-19 Center frequency measuring method for celamic filter

Publications (2)

Publication Number Publication Date
JPS51150249A true JPS51150249A (en) 1976-12-23
JPS5634826B2 JPS5634826B2 (en:Method) 1981-08-13

Family

ID=13528048

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7378075A Granted JPS51150249A (en) 1975-06-19 1975-06-19 Center frequency measuring method for celamic filter

Country Status (1)

Country Link
JP (1) JPS51150249A (en:Method)

Also Published As

Publication number Publication date
JPS5634826B2 (en:Method) 1981-08-13

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