JPS51147181A - Detection method of accident location in semiconductor elements - Google Patents
Detection method of accident location in semiconductor elementsInfo
- Publication number
- JPS51147181A JPS51147181A JP7158475A JP7158475A JPS51147181A JP S51147181 A JPS51147181 A JP S51147181A JP 7158475 A JP7158475 A JP 7158475A JP 7158475 A JP7158475 A JP 7158475A JP S51147181 A JPS51147181 A JP S51147181A
- Authority
- JP
- Japan
- Prior art keywords
- detection method
- semiconductor elements
- accident location
- accident
- location
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE: To detect exactly a location of accident with abnormal heating such as a short-circuit of the semiconductor element in a short time by a simple operation.
COPYRIGHT: (C)1976,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7158475A JPS5821425B2 (en) | 1975-06-12 | 1975-06-12 | How to use hand tools |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7158475A JPS5821425B2 (en) | 1975-06-12 | 1975-06-12 | How to use hand tools |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS51147181A true JPS51147181A (en) | 1976-12-17 |
JPS5821425B2 JPS5821425B2 (en) | 1983-04-30 |
Family
ID=13464876
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7158475A Expired JPS5821425B2 (en) | 1975-06-12 | 1975-06-12 | How to use hand tools |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5821425B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015023114A (en) * | 2013-07-18 | 2015-02-02 | 信越半導体株式会社 | Method of evaluating semiconductor element |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62184191A (en) * | 1986-02-07 | 1987-08-12 | 関東レザ−株式会社 | Production of dew condensation preventing wallpaper having embossed pattern |
JPH01139899A (en) * | 1987-08-12 | 1989-06-01 | Toyo Tire & Rubber Co Ltd | Humidity permeable dew condensation preventing wallpaper and its production |
JPH0421840Y2 (en) * | 1988-04-19 | 1992-05-19 |
-
1975
- 1975-06-12 JP JP7158475A patent/JPS5821425B2/en not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015023114A (en) * | 2013-07-18 | 2015-02-02 | 信越半導体株式会社 | Method of evaluating semiconductor element |
Also Published As
Publication number | Publication date |
---|---|
JPS5821425B2 (en) | 1983-04-30 |
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