JPS51146886A - A defficiency monitor for nonnbreakdown inspection - Google Patents

A defficiency monitor for nonnbreakdown inspection

Info

Publication number
JPS51146886A
JPS51146886A JP50070470A JP7047075A JPS51146886A JP S51146886 A JPS51146886 A JP S51146886A JP 50070470 A JP50070470 A JP 50070470A JP 7047075 A JP7047075 A JP 7047075A JP S51146886 A JPS51146886 A JP S51146886A
Authority
JP
Japan
Prior art keywords
defficiency
nonnbreakdown
inspection
monitor
scanning line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP50070470A
Other languages
Japanese (ja)
Inventor
Hiroshi Kikuchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP50070470A priority Critical patent/JPS51146886A/en
Publication of JPS51146886A publication Critical patent/JPS51146886A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:Altering the scanning line direction of a light receiving part or a display part allows the difference of the defficiency discrimination degree depending on the scanning line direction to be solved.
JP50070470A 1975-06-11 1975-06-11 A defficiency monitor for nonnbreakdown inspection Pending JPS51146886A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50070470A JPS51146886A (en) 1975-06-11 1975-06-11 A defficiency monitor for nonnbreakdown inspection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50070470A JPS51146886A (en) 1975-06-11 1975-06-11 A defficiency monitor for nonnbreakdown inspection

Publications (1)

Publication Number Publication Date
JPS51146886A true JPS51146886A (en) 1976-12-16

Family

ID=13432432

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50070470A Pending JPS51146886A (en) 1975-06-11 1975-06-11 A defficiency monitor for nonnbreakdown inspection

Country Status (1)

Country Link
JP (1) JPS51146886A (en)

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