JPS51135439A - Electronic circuit testing system - Google Patents

Electronic circuit testing system

Info

Publication number
JPS51135439A
JPS51135439A JP50059975A JP5997575A JPS51135439A JP S51135439 A JPS51135439 A JP S51135439A JP 50059975 A JP50059975 A JP 50059975A JP 5997575 A JP5997575 A JP 5997575A JP S51135439 A JPS51135439 A JP S51135439A
Authority
JP
Japan
Prior art keywords
electronic circuit
testing system
circuit testing
damaged part
circutit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP50059975A
Other languages
Japanese (ja)
Other versions
JPS5426464B2 (en
Inventor
Masayuki Inagaki
Nobuo Wakatsuki
Hirokazu Nomura
Toshio Nakamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP50059975A priority Critical patent/JPS51135439A/en
Publication of JPS51135439A publication Critical patent/JPS51135439A/en
Publication of JPS5426464B2 publication Critical patent/JPS5426464B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE: To automatically determine circutit units and connector terminals simultaneously and point out automatically the damaged part by using measurement signal and pre-counted correct value, thus shortening detection time and indicating damaged part correctly.
COPYRIGHT: (C)1976,JPO&Japio
JP50059975A 1975-05-20 1975-05-20 Electronic circuit testing system Granted JPS51135439A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50059975A JPS51135439A (en) 1975-05-20 1975-05-20 Electronic circuit testing system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50059975A JPS51135439A (en) 1975-05-20 1975-05-20 Electronic circuit testing system

Publications (2)

Publication Number Publication Date
JPS51135439A true JPS51135439A (en) 1976-11-24
JPS5426464B2 JPS5426464B2 (en) 1979-09-04

Family

ID=13128670

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50059975A Granted JPS51135439A (en) 1975-05-20 1975-05-20 Electronic circuit testing system

Country Status (1)

Country Link
JP (1) JPS51135439A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50105240A (en) * 1974-01-25 1975-08-19

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50105240A (en) * 1974-01-25 1975-08-19

Also Published As

Publication number Publication date
JPS5426464B2 (en) 1979-09-04

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