JPS51123673A - A x-ray diffraction angle measuring device - Google Patents

A x-ray diffraction angle measuring device

Info

Publication number
JPS51123673A
JPS51123673A JP50047581A JP4758175A JPS51123673A JP S51123673 A JPS51123673 A JP S51123673A JP 50047581 A JP50047581 A JP 50047581A JP 4758175 A JP4758175 A JP 4758175A JP S51123673 A JPS51123673 A JP S51123673A
Authority
JP
Japan
Prior art keywords
diffraction angle
measuring device
ray diffraction
angle measuring
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP50047581A
Other languages
Japanese (ja)
Other versions
JPS5333279B2 (en
Inventor
Katsuo Ono
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RIGAKU DENKI KK
Rigaku Denki Co Ltd
Original Assignee
RIGAKU DENKI KK
Rigaku Denki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by RIGAKU DENKI KK, Rigaku Denki Co Ltd filed Critical RIGAKU DENKI KK
Priority to JP50047581A priority Critical patent/JPS51123673A/en
Publication of JPS51123673A publication Critical patent/JPS51123673A/en
Publication of JPS5333279B2 publication Critical patent/JPS5333279B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To accurately obtain the diffraction angle of X-ray without any difficult installation operation on test materials.
JP50047581A 1975-04-21 1975-04-21 A x-ray diffraction angle measuring device Granted JPS51123673A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50047581A JPS51123673A (en) 1975-04-21 1975-04-21 A x-ray diffraction angle measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50047581A JPS51123673A (en) 1975-04-21 1975-04-21 A x-ray diffraction angle measuring device

Publications (2)

Publication Number Publication Date
JPS51123673A true JPS51123673A (en) 1976-10-28
JPS5333279B2 JPS5333279B2 (en) 1978-09-13

Family

ID=12779206

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50047581A Granted JPS51123673A (en) 1975-04-21 1975-04-21 A x-ray diffraction angle measuring device

Country Status (1)

Country Link
JP (1) JPS51123673A (en)

Also Published As

Publication number Publication date
JPS5333279B2 (en) 1978-09-13

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