JPS51114980A - Noise removal circuit of ae measurement system - Google Patents

Noise removal circuit of ae measurement system

Info

Publication number
JPS51114980A
JPS51114980A JP50039056A JP3905675A JPS51114980A JP S51114980 A JPS51114980 A JP S51114980A JP 50039056 A JP50039056 A JP 50039056A JP 3905675 A JP3905675 A JP 3905675A JP S51114980 A JPS51114980 A JP S51114980A
Authority
JP
Japan
Prior art keywords
measurement system
noise removal
removal circuit
output
sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP50039056A
Other languages
Japanese (ja)
Inventor
Takeshi Kagawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Power Ltd
Original Assignee
Babcock Hitachi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Babcock Hitachi KK filed Critical Babcock Hitachi KK
Priority to JP50039056A priority Critical patent/JPS51114980A/en
Publication of JPS51114980A publication Critical patent/JPS51114980A/en
Pending legal-status Critical Current

Links

Landscapes

  • Machine Tool Sensing Apparatuses (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Abstract

PURPOSE: The output from the AE(Acoustic Emission) sensor is conducted and controlled by an output from a dummy sensor, and noise from outside the system is removed when measuring AE.
COPYRIGHT: (C)1976,JPO&Japio
JP50039056A 1975-04-02 1975-04-02 Noise removal circuit of ae measurement system Pending JPS51114980A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50039056A JPS51114980A (en) 1975-04-02 1975-04-02 Noise removal circuit of ae measurement system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50039056A JPS51114980A (en) 1975-04-02 1975-04-02 Noise removal circuit of ae measurement system

Publications (1)

Publication Number Publication Date
JPS51114980A true JPS51114980A (en) 1976-10-09

Family

ID=12542462

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50039056A Pending JPS51114980A (en) 1975-04-02 1975-04-02 Noise removal circuit of ae measurement system

Country Status (1)

Country Link
JP (1) JPS51114980A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5720659A (en) * 1980-07-14 1982-02-03 Nippon Kokan Kk <Nkk> Detection of weld defect
JPS60357A (en) * 1983-06-16 1985-01-05 Agency Of Ind Science & Technol Measuring device of acoustic emission
JPS60143789A (en) * 1983-12-29 1985-07-30 Electric Power Dev Co Ltd Partial discharge detection apparatus
JPH06341942A (en) * 1993-06-01 1994-12-13 Nec Corp Measuring method for adhesion of thin film and device therefor
JP2016180598A (en) * 2015-03-23 2016-10-13 株式会社東芝 Detection system and detection method

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5720659A (en) * 1980-07-14 1982-02-03 Nippon Kokan Kk <Nkk> Detection of weld defect
JPS60357A (en) * 1983-06-16 1985-01-05 Agency Of Ind Science & Technol Measuring device of acoustic emission
JPH0254504B2 (en) * 1983-06-16 1990-11-21 Kogyo Gijutsuin
JPS60143789A (en) * 1983-12-29 1985-07-30 Electric Power Dev Co Ltd Partial discharge detection apparatus
JPH06341942A (en) * 1993-06-01 1994-12-13 Nec Corp Measuring method for adhesion of thin film and device therefor
JP2016180598A (en) * 2015-03-23 2016-10-13 株式会社東芝 Detection system and detection method
US10444197B2 (en) 2015-03-23 2019-10-15 Kabushiki Kaisha Toshiba Detection system and detection method
US10551353B2 (en) 2015-03-23 2020-02-04 Kabushiki Kaisha Toshiba Detection system and detection method

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