JPS5098282A - - Google Patents

Info

Publication number
JPS5098282A
JPS5098282A JP49000412A JP41274A JPS5098282A JP S5098282 A JPS5098282 A JP S5098282A JP 49000412 A JP49000412 A JP 49000412A JP 41274 A JP41274 A JP 41274A JP S5098282 A JPS5098282 A JP S5098282A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP49000412A
Other languages
Japanese (ja)
Other versions
JPS5751734B2 (cs
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP74412A priority Critical patent/JPS5751734B2/ja
Publication of JPS5098282A publication Critical patent/JPS5098282A/ja
Publication of JPS5751734B2 publication Critical patent/JPS5751734B2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP74412A 1973-12-26 1973-12-26 Expired JPS5751734B2 (cs)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP74412A JPS5751734B2 (cs) 1973-12-26 1973-12-26

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP74412A JPS5751734B2 (cs) 1973-12-26 1973-12-26

Publications (2)

Publication Number Publication Date
JPS5098282A true JPS5098282A (cs) 1975-08-05
JPS5751734B2 JPS5751734B2 (cs) 1982-11-04

Family

ID=11473070

Family Applications (1)

Application Number Title Priority Date Filing Date
JP74412A Expired JPS5751734B2 (cs) 1973-12-26 1973-12-26

Country Status (1)

Country Link
JP (1) JPS5751734B2 (cs)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62876A (ja) * 1985-06-27 1987-01-06 Mitsubishi Electric Corp 半導体集積回路用試験装置
JPH0459145U (cs) * 1990-09-28 1992-05-21
JPH0459144U (cs) * 1990-09-28 1992-05-21
JPH0459146U (cs) * 1990-09-28 1992-05-21

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62876A (ja) * 1985-06-27 1987-01-06 Mitsubishi Electric Corp 半導体集積回路用試験装置
JPH0459145U (cs) * 1990-09-28 1992-05-21
JPH0459144U (cs) * 1990-09-28 1992-05-21
JPH0459146U (cs) * 1990-09-28 1992-05-21

Also Published As

Publication number Publication date
JPS5751734B2 (cs) 1982-11-04

Similar Documents

Publication Publication Date Title
AR201758A1 (cs)
AR201235Q (cs)
AR201231Q (cs)
AR201229Q (cs)
AR199451A1 (cs)
JPS5751734B2 (cs)
AR200256A1 (cs)
AR193950A1 (cs)
AU447540B2 (cs)
AR201432A1 (cs)
AR200885A1 (cs)
AR197627A1 (cs)
AR196382A1 (cs)
AU477824B2 (cs)
AR210729A1 (cs)
AR195948A1 (cs)
AR195311A1 (cs)
AR196123Q (cs)
AU1891376A (cs)
AR196212Q (cs)
BG26947A3 (cs)
BG18905A1 (cs)
AU479521A (cs)
AU479504A (cs)
AU479496A (cs)