JPS5085268U - - Google Patents

Info

Publication number
JPS5085268U
JPS5085268U JP13989973U JP13989973U JPS5085268U JP S5085268 U JPS5085268 U JP S5085268U JP 13989973 U JP13989973 U JP 13989973U JP 13989973 U JP13989973 U JP 13989973U JP S5085268 U JPS5085268 U JP S5085268U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13989973U
Other versions
JPS537743Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP13989973U priority Critical patent/JPS537743Y2/ja
Publication of JPS5085268U publication Critical patent/JPS5085268U/ja
Application granted granted Critical
Publication of JPS537743Y2 publication Critical patent/JPS537743Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
JP13989973U 1973-12-06 1973-12-06 Expired JPS537743Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13989973U JPS537743Y2 (ja) 1973-12-06 1973-12-06

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13989973U JPS537743Y2 (ja) 1973-12-06 1973-12-06

Publications (2)

Publication Number Publication Date
JPS5085268U true JPS5085268U (ja) 1975-07-21
JPS537743Y2 JPS537743Y2 (ja) 1978-02-27

Family

ID=28416568

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13989973U Expired JPS537743Y2 (ja) 1973-12-06 1973-12-06

Country Status (1)

Country Link
JP (1) JPS537743Y2 (ja)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010139446A (ja) * 2008-12-12 2010-06-24 Hioki Ee Corp 積分球及び測光装置
JP2011137789A (ja) * 2010-01-04 2011-07-14 Hioki Ee Corp 測光装置
JP2011145274A (ja) * 2009-12-16 2011-07-28 Hioki Ee Corp 測光装置
JP2012518182A (ja) * 2009-02-20 2012-08-09 キューエムシー カンパニー リミテッド エルイーディーチップテスト装置｛ｌｅｄｃｈｉｐｔｅｓｔｉｎｇａｐｐａｒａｔｕｓ｝
JP5406402B1 (ja) * 2013-04-24 2014-02-05 日本分光株式会社 積分球、および、透過光の測定方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010133833A (ja) * 2008-12-04 2010-06-17 Hioki Ee Corp 測光装置

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010139446A (ja) * 2008-12-12 2010-06-24 Hioki Ee Corp 積分球及び測光装置
JP2012518182A (ja) * 2009-02-20 2012-08-09 キューエムシー カンパニー リミテッド エルイーディーチップテスト装置｛ｌｅｄｃｈｉｐｔｅｓｔｉｎｇａｐｐａｒａｔｕｓ｝
JP2011145274A (ja) * 2009-12-16 2011-07-28 Hioki Ee Corp 測光装置
JP2011137789A (ja) * 2010-01-04 2011-07-14 Hioki Ee Corp 測光装置
JP5406402B1 (ja) * 2013-04-24 2014-02-05 日本分光株式会社 積分球、および、透過光の測定方法

Also Published As

Publication number Publication date
JPS537743Y2 (ja) 1978-02-27

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