JPS5084993A - - Google Patents

Info

Publication number
JPS5084993A
JPS5084993A JP13467373A JP13467373A JPS5084993A JP S5084993 A JPS5084993 A JP S5084993A JP 13467373 A JP13467373 A JP 13467373A JP 13467373 A JP13467373 A JP 13467373A JP S5084993 A JPS5084993 A JP S5084993A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13467373A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP13467373A priority Critical patent/JPS5084993A/ja
Publication of JPS5084993A publication Critical patent/JPS5084993A/ja
Pending legal-status Critical Current

Links

Landscapes

  • Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
JP13467373A 1973-11-29 1973-11-29 Pending JPS5084993A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13467373A JPS5084993A (ja) 1973-11-29 1973-11-29

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13467373A JPS5084993A (ja) 1973-11-29 1973-11-29

Publications (1)

Publication Number Publication Date
JPS5084993A true JPS5084993A (ja) 1975-07-09

Family

ID=15133877

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13467373A Pending JPS5084993A (ja) 1973-11-29 1973-11-29

Country Status (1)

Country Link
JP (1) JPS5084993A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0335928A (ja) * 1989-06-30 1991-02-15 Toshiba Corp 表面あらさ測定装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0335928A (ja) * 1989-06-30 1991-02-15 Toshiba Corp 表面あらさ測定装置

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