JPS5080879A - - Google Patents
Info
- Publication number
- JPS5080879A JPS5080879A JP12768473A JP12768473A JPS5080879A JP S5080879 A JPS5080879 A JP S5080879A JP 12768473 A JP12768473 A JP 12768473A JP 12768473 A JP12768473 A JP 12768473A JP S5080879 A JPS5080879 A JP S5080879A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Filamentary Materials, Packages, And Safety Devices Therefor (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12768473A JPS5080879A (enrdf_load_html_response) | 1973-11-15 | 1973-11-15 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12768473A JPS5080879A (enrdf_load_html_response) | 1973-11-15 | 1973-11-15 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5080879A true JPS5080879A (enrdf_load_html_response) | 1975-07-01 |
Family
ID=14966138
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12768473A Pending JPS5080879A (enrdf_load_html_response) | 1973-11-15 | 1973-11-15 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5080879A (enrdf_load_html_response) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5364723U (enrdf_load_html_response) * | 1976-10-18 | 1978-05-31 | ||
JPS5443884A (en) * | 1977-09-16 | 1979-04-06 | Toyo Seiki Seisakusho Kk | Apparatus for measuring thickness of vacuum evaporation film |
JP2002340799A (ja) * | 2001-05-14 | 2002-11-27 | Mitsui Eng & Shipbuild Co Ltd | 透孔板の透過率測定方法およびその装置 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2381414A (en) * | 1943-01-16 | 1945-08-07 | John B Wilkie | Measuring instrument |
US3151247A (en) * | 1961-05-31 | 1964-09-29 | Texas Instruments Inc | Heterogeneous radiation analysis using a rotating reticle for modulating different portions of a spectral display |
-
1973
- 1973-11-15 JP JP12768473A patent/JPS5080879A/ja active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2381414A (en) * | 1943-01-16 | 1945-08-07 | John B Wilkie | Measuring instrument |
US3151247A (en) * | 1961-05-31 | 1964-09-29 | Texas Instruments Inc | Heterogeneous radiation analysis using a rotating reticle for modulating different portions of a spectral display |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5364723U (enrdf_load_html_response) * | 1976-10-18 | 1978-05-31 | ||
JPS5443884A (en) * | 1977-09-16 | 1979-04-06 | Toyo Seiki Seisakusho Kk | Apparatus for measuring thickness of vacuum evaporation film |
JP2002340799A (ja) * | 2001-05-14 | 2002-11-27 | Mitsui Eng & Shipbuild Co Ltd | 透孔板の透過率測定方法およびその装置 |