JPS5057975A - - Google Patents
Info
- Publication number
- JPS5057975A JPS5057975A JP10828173A JP10828173A JPS5057975A JP S5057975 A JPS5057975 A JP S5057975A JP 10828173 A JP10828173 A JP 10828173A JP 10828173 A JP10828173 A JP 10828173A JP S5057975 A JPS5057975 A JP S5057975A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
- Physical Vapour Deposition (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10828173A JPS5339875B2 (en) | 1973-09-25 | 1973-09-25 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10828173A JPS5339875B2 (en) | 1973-09-25 | 1973-09-25 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5057975A true JPS5057975A (en) | 1975-05-20 |
| JPS5339875B2 JPS5339875B2 (en) | 1978-10-24 |
Family
ID=14480657
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10828173A Expired JPS5339875B2 (en) | 1973-09-25 | 1973-09-25 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5339875B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107557732A (en) * | 2017-08-29 | 2018-01-09 | 京东方科技集团股份有限公司 | Mask plate and evaporation coating device, the evaporation process and method for testing thicknesses of layers is deposited |
-
1973
- 1973-09-25 JP JP10828173A patent/JPS5339875B2/ja not_active Expired
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107557732A (en) * | 2017-08-29 | 2018-01-09 | 京东方科技集团股份有限公司 | Mask plate and evaporation coating device, the evaporation process and method for testing thicknesses of layers is deposited |
| CN107557732B (en) * | 2017-08-29 | 2019-06-07 | 京东方科技集团股份有限公司 | Mask plate and evaporation coating device, evaporation process and the method for testing thicknesses of layers is deposited |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5339875B2 (en) | 1978-10-24 |