JPS5042890A - - Google Patents
Info
- Publication number
- JPS5042890A JPS5042890A JP49035200A JP3520074A JPS5042890A JP S5042890 A JPS5042890 A JP S5042890A JP 49035200 A JP49035200 A JP 49035200A JP 3520074 A JP3520074 A JP 3520074A JP S5042890 A JPS5042890 A JP S5042890A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping
- H01J49/4215—Quadrupole mass filters
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J1/00—Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps
- H01J1/52—Screens for shielding; Guides for influencing the discharge; Masks interposed in the electron stream
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US346250A US3867632A (en) | 1973-03-30 | 1973-03-30 | Methods and apparatus for spatial separation of AC and DC electrical fields with application to fringe fields in quadrupole mass filters |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5042890A true JPS5042890A (en) | 1975-04-18 |
JPS5833659B2 JPS5833659B2 (en) | 1983-07-21 |
Family
ID=23358586
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP49035200A Expired JPS5833659B2 (en) | 1973-03-30 | 1974-03-30 | Method and apparatus for improving the efficiency of ion injection or transmission through a quadrupole mass filter |
Country Status (5)
Country | Link |
---|---|
US (1) | US3867632A (en) |
JP (1) | JPS5833659B2 (en) |
DE (1) | DE2415259A1 (en) |
FR (1) | FR2228294B1 (en) |
GB (1) | GB1460634A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5150784A (en) * | 1974-08-30 | 1976-05-04 | Extranuclear Lab Inc |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3937954A (en) * | 1973-03-30 | 1976-02-10 | Extranuclear Laboratories, Inc. | Methods and apparatus for spatial separation of AC and DC electric fields, with application to fringe fields in quadrupole mass filters |
US3936634A (en) * | 1973-03-30 | 1976-02-03 | Extranuclear Laboratories Inc. | Method and apparatus for improved focusing of ion currents in quadrupole mass filter |
US4283626A (en) * | 1979-11-08 | 1981-08-11 | Extranuclear Laboratories, Inc. | Methods and apparatus for analysis of mixtures by mass spectrometry |
US4481415A (en) * | 1982-10-27 | 1984-11-06 | Shimadzu Corporation | Quadrupole mass spectrometer |
US4814613A (en) * | 1987-03-06 | 1989-03-21 | Extrel Corporation | Collision cell for triple quadrupole tandem mass spectrometry |
US5495107A (en) * | 1994-04-06 | 1996-02-27 | Thermo Jarrell Ash Corporation | Analysis |
US6153880A (en) * | 1999-09-30 | 2000-11-28 | Agilent Technologies, Inc. | Method and apparatus for performance improvement of mass spectrometers using dynamic ion optics |
GB0703682D0 (en) * | 2007-02-26 | 2007-04-04 | Micromass Ltd | Mass spectrometer |
DE102008053088A1 (en) | 2008-10-24 | 2010-05-20 | Bruker Daltonik Gmbh | Aperture diaphragms between high frequency ion guide systems |
US8258470B2 (en) * | 2008-12-15 | 2012-09-04 | Edward W Sheehan | Radio frequency lens for introducing ions into a quadrupole mass analyzer |
CN111937116A (en) | 2018-04-05 | 2020-11-13 | 慕尼黑科技大学 | Partially sealed ion guide and ion beam deposition system |
CN112490110B (en) * | 2020-12-01 | 2024-07-16 | 常州磐诺仪器有限公司 | Quadrupole rod electrode system for quadrupole mass spectrum |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3129327A (en) * | 1961-12-12 | 1964-04-14 | Bell & Howell Co | Auxiliary electrodes for quadrupole mass filters |
US3617736A (en) * | 1968-06-19 | 1971-11-02 | Hewlett Packard Co | Quadrupole mass filter with electrode structure for fringing-field compensation |
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1973
- 1973-03-30 US US346250A patent/US3867632A/en not_active Expired - Lifetime
-
1974
- 1974-03-27 GB GB1362674A patent/GB1460634A/en not_active Expired
- 1974-03-28 FR FR7410874A patent/FR2228294B1/fr not_active Expired
- 1974-03-29 DE DE2415259A patent/DE2415259A1/en not_active Withdrawn
- 1974-03-30 JP JP49035200A patent/JPS5833659B2/en not_active Expired
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5150784A (en) * | 1974-08-30 | 1976-05-04 | Extranuclear Lab Inc | |
JPS5833660B2 (en) * | 1974-08-30 | 1983-07-21 | エクステラニユ−クリア−− ラボラトリ−ズ インコ−ポレ−テツド | Method and apparatus for improving the efficiency of ion injection or transmission through a quadrupole mass filter |
Also Published As
Publication number | Publication date |
---|---|
GB1460634A (en) | 1977-01-06 |
FR2228294B1 (en) | 1978-03-24 |
JPS5833659B2 (en) | 1983-07-21 |
US3867632A (en) | 1975-02-18 |
DE2415259A1 (en) | 1975-01-30 |
FR2228294A1 (en) | 1974-11-29 |