JPS5040676B1 - - Google Patents
Info
- Publication number
- JPS5040676B1 JPS5040676B1 JP46053553A JP5355371A JPS5040676B1 JP S5040676 B1 JPS5040676 B1 JP S5040676B1 JP 46053553 A JP46053553 A JP 46053553A JP 5355371 A JP5355371 A JP 5355371A JP S5040676 B1 JPS5040676 B1 JP S5040676B1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP46053553A JPS5040676B1 (enExample) | 1971-07-20 | 1971-07-20 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP46053553A JPS5040676B1 (enExample) | 1971-07-20 | 1971-07-20 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5040676B1 true JPS5040676B1 (enExample) | 1975-12-25 |
Family
ID=12945974
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP46053553A Pending JPS5040676B1 (enExample) | 1971-07-20 | 1971-07-20 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5040676B1 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5242162U (enExample) * | 1975-09-19 | 1977-03-25 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3072789A (en) * | 1960-06-13 | 1963-01-08 | Philips Corp | X-ray spectral analysis |
| US3566111A (en) * | 1967-06-19 | 1971-02-23 | Siemens Ag | Apparatus for varying the detector slit width in fully focusing x-ray spectrometers |
-
1971
- 1971-07-20 JP JP46053553A patent/JPS5040676B1/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3072789A (en) * | 1960-06-13 | 1963-01-08 | Philips Corp | X-ray spectral analysis |
| US3566111A (en) * | 1967-06-19 | 1971-02-23 | Siemens Ag | Apparatus for varying the detector slit width in fully focusing x-ray spectrometers |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5242162U (enExample) * | 1975-09-19 | 1977-03-25 |