JPS5038582A - - Google Patents

Info

Publication number
JPS5038582A
JPS5038582A JP8834673A JP8834673A JPS5038582A JP S5038582 A JPS5038582 A JP S5038582A JP 8834673 A JP8834673 A JP 8834673A JP 8834673 A JP8834673 A JP 8834673A JP S5038582 A JPS5038582 A JP S5038582A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8834673A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP8834673A priority Critical patent/JPS5038582A/ja
Publication of JPS5038582A publication Critical patent/JPS5038582A/ja
Pending legal-status Critical Current

Links

Landscapes

  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP8834673A 1973-08-08 1973-08-08 Pending JPS5038582A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8834673A JPS5038582A (ja) 1973-08-08 1973-08-08

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8834673A JPS5038582A (ja) 1973-08-08 1973-08-08

Publications (1)

Publication Number Publication Date
JPS5038582A true JPS5038582A (ja) 1975-04-10

Family

ID=13940269

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8834673A Pending JPS5038582A (ja) 1973-08-08 1973-08-08

Country Status (1)

Country Link
JP (1) JPS5038582A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001235430A (ja) * 2000-02-25 2001-08-31 Nikon Corp 光学式検査装置および光学式表面検査装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001235430A (ja) * 2000-02-25 2001-08-31 Nikon Corp 光学式検査装置および光学式表面検査装置

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