JPS503578A - - Google Patents

Info

Publication number
JPS503578A
JPS503578A JP5332973A JP5332973A JPS503578A JP S503578 A JPS503578 A JP S503578A JP 5332973 A JP5332973 A JP 5332973A JP 5332973 A JP5332973 A JP 5332973A JP S503578 A JPS503578 A JP S503578A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5332973A
Other versions
JPS5128985B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP5332973A priority Critical patent/JPS5128985B2/ja
Publication of JPS503578A publication Critical patent/JPS503578A/ja
Publication of JPS5128985B2 publication Critical patent/JPS5128985B2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP5332973A 1973-05-14 1973-05-14 Expired JPS5128985B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5332973A JPS5128985B2 (ja) 1973-05-14 1973-05-14

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5332973A JPS5128985B2 (ja) 1973-05-14 1973-05-14

Publications (2)

Publication Number Publication Date
JPS503578A true JPS503578A (ja) 1975-01-14
JPS5128985B2 JPS5128985B2 (ja) 1976-08-23

Family

ID=12939677

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5332973A Expired JPS5128985B2 (ja) 1973-05-14 1973-05-14

Country Status (1)

Country Link
JP (1) JPS5128985B2 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5480088A (en) * 1977-12-09 1979-06-26 Hitachi Ltd Characteristics testing electrode
JP2003084031A (ja) * 2001-09-12 2003-03-19 Nippon Inter Electronics Corp 樹脂封止型半導体素子の特性検査装置

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5824184A (ja) * 1981-08-06 1983-02-14 三菱レイヨン株式会社 デイスプレイ装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5480088A (en) * 1977-12-09 1979-06-26 Hitachi Ltd Characteristics testing electrode
JP2003084031A (ja) * 2001-09-12 2003-03-19 Nippon Inter Electronics Corp 樹脂封止型半導体素子の特性検査装置

Also Published As

Publication number Publication date
JPS5128985B2 (ja) 1976-08-23

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