JPS5024072A - - Google Patents
Info
- Publication number
- JPS5024072A JPS5024072A JP48074808A JP7480873A JPS5024072A JP S5024072 A JPS5024072 A JP S5024072A JP 48074808 A JP48074808 A JP 48074808A JP 7480873 A JP7480873 A JP 7480873A JP S5024072 A JPS5024072 A JP S5024072A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP48074808A JPS5024072A (enrdf_load_stackoverflow) | 1973-07-04 | 1973-07-04 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP48074808A JPS5024072A (enrdf_load_stackoverflow) | 1973-07-04 | 1973-07-04 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5024072A true JPS5024072A (enrdf_load_stackoverflow) | 1975-03-14 |
Family
ID=13557966
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP48074808A Pending JPS5024072A (enrdf_load_stackoverflow) | 1973-07-04 | 1973-07-04 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5024072A (enrdf_load_stackoverflow) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6148647U (enrdf_load_stackoverflow) * | 1984-08-31 | 1986-04-01 | ||
| JP2011514651A (ja) * | 2008-03-17 | 2011-05-06 | プロトチップス，インコーポレイテッド | 電子顕微鏡にサンプルを装着するために用いられる標本ホルダ |
| EP2824448A1 (en) * | 2013-07-08 | 2015-01-14 | Bruker Nano GmbH | Sample holder for electron backscatter diffraction |
| JP2015056395A (ja) * | 2013-09-13 | 2015-03-23 | 日立ハイテクノロジーズコリア株式会社 | 試料の断面観察に用いられる試料ホルダー及びその制御方法 |
| US9312097B2 (en) | 2007-05-09 | 2016-04-12 | Protochips, Inc. | Specimen holder used for mounting samples in electron microscopes |
| JP2020136275A (ja) * | 2019-02-21 | 2020-08-31 | エフ イー アイ カンパニＦｅｉ Ｃｏｍｐａｎｙ | 荷電粒子顕微鏡用の試料ホルダー |
-
1973
- 1973-07-04 JP JP48074808A patent/JPS5024072A/ja active Pending
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6148647U (enrdf_load_stackoverflow) * | 1984-08-31 | 1986-04-01 | ||
| US9312097B2 (en) | 2007-05-09 | 2016-04-12 | Protochips, Inc. | Specimen holder used for mounting samples in electron microscopes |
| JP2011514651A (ja) * | 2008-03-17 | 2011-05-06 | プロトチップス，インコーポレイテッド | 電子顕微鏡にサンプルを装着するために用いられる標本ホルダ |
| US8853646B2 (en) | 2008-03-17 | 2014-10-07 | Protochips, Inc. | Specimen holder used for mounting samples in electron microscopes |
| US8859991B2 (en) | 2008-03-17 | 2014-10-14 | Protochips, Inc. | Specimen holder used for mounting samples in electron microscopes |
| USRE48201E1 (en) | 2008-03-17 | 2020-09-08 | Protochips, Inc. | Specimen holder used for mounting samples in electron microscopes |
| EP2824448A1 (en) * | 2013-07-08 | 2015-01-14 | Bruker Nano GmbH | Sample holder for electron backscatter diffraction |
| JP2015056395A (ja) * | 2013-09-13 | 2015-03-23 | 日立ハイテクノロジーズコリア株式会社 | 試料の断面観察に用いられる試料ホルダー及びその制御方法 |
| JP2020136275A (ja) * | 2019-02-21 | 2020-08-31 | エフ イー アイ カンパニＦｅｉ Ｃｏｍｐａｎｙ | 荷電粒子顕微鏡用の試料ホルダー |