JPS5023280A - - Google Patents
Info
- Publication number
- JPS5023280A JPS5023280A JP49061952A JP6195274A JPS5023280A JP S5023280 A JPS5023280 A JP S5023280A JP 49061952 A JP49061952 A JP 49061952A JP 6195274 A JP6195274 A JP 6195274A JP S5023280 A JPS5023280 A JP S5023280A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Measurement Of Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US366488A US3859525A (en) | 1973-06-04 | 1973-06-04 | Method and apparatus for fluorescent x-ray analysis |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5023280A true JPS5023280A (ja) | 1975-03-12 |
Family
ID=23443223
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP49061952A Pending JPS5023280A (ja) | 1973-06-04 | 1974-06-03 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US3859525A (ja) |
| JP (1) | JPS5023280A (ja) |
| CA (1) | CA994012A (ja) |
| DE (1) | DE2426794A1 (ja) |
| FR (1) | FR2231977B1 (ja) |
| GB (1) | GB1462507A (ja) |
| NL (1) | NL7407489A (ja) |
| ZA (1) | ZA743510B (ja) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3936633A (en) * | 1973-01-04 | 1976-02-03 | The United States Of America As Represented By The United States Energy Research & Development Administration | Method of determining lanthanidies in a transition element host |
| JPS5139188A (en) * | 1974-09-30 | 1976-04-01 | Horiba Ltd | Hibunsangatakeikoxsenbunsekisochi |
| US4362935A (en) * | 1979-02-09 | 1982-12-07 | Martin Marietta Corporation | Field portable element analysis unit |
| US4392236A (en) * | 1981-03-16 | 1983-07-05 | Guardsman Chemicals, Inc. | System and method of migratory animal identification by fluorescence spectroscopy of element coded implanted tags, and tags used therein |
| US4585941A (en) * | 1983-02-28 | 1986-04-29 | E. R. Squibb & Sons, Inc. | Dosimetry system for strontium-rubidium infusion pump |
| FI67956C (fi) * | 1983-09-22 | 1985-06-10 | Mexpert Oy | Pao roentgendiffraktion sig grundande foerfarande och anordning foer maetning av spaenningar |
| US5742658A (en) * | 1996-05-23 | 1998-04-21 | Advanced Micro Devices, Inc. | Apparatus and method for determining the elemental compositions and relative locations of particles on the surface of a semiconductor wafer |
| US6005915A (en) * | 1997-11-07 | 1999-12-21 | Advanced Micro Devices, Inc. | Apparatus and method for measuring the roughness of a target material surface based upon the scattering of incident X-ray photons |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3247377A (en) * | 1962-04-12 | 1966-04-19 | Texaco Inc | Scintillation-type well logging device with two crystals responding separately to thermal neutrons and gamma rays |
| GB1016906A (en) * | 1962-05-24 | 1966-01-12 | Atomic Energy Authority Uk | Improvements in or relating to the measurement of the quantity of silver in photographic films |
| GB1017595A (en) * | 1962-06-20 | 1966-01-19 | Atomic Energy Authority Uk | Improvements in or relating to radiometric analysis techniques |
| US3288996A (en) * | 1963-06-13 | 1966-11-29 | Dresser Ind | Compound scintillation detector for simultaneous detection of thermal and epithermal neutrons |
| GB1067430A (en) * | 1964-09-11 | 1967-05-03 | Atomic Energy Authority Uk | Improvements in or relating to x-ray analysis |
| US3588536A (en) * | 1968-07-16 | 1971-06-28 | United States Steel Corp | Pulse height analyzer |
| US3581087A (en) * | 1968-10-25 | 1971-05-25 | Panametrics | X-ray fluorescence measuring system employing balanced x-ray filters and circuit means to vary the effective relative transmission thereof |
-
1973
- 1973-06-04 US US366488A patent/US3859525A/en not_active Expired - Lifetime
-
1974
- 1974-06-03 CA CA201,488A patent/CA994012A/en not_active Expired
- 1974-06-03 JP JP49061952A patent/JPS5023280A/ja active Pending
- 1974-06-03 ZA ZA00743510A patent/ZA743510B/xx unknown
- 1974-06-04 DE DE19742426794 patent/DE2426794A1/de active Pending
- 1974-06-04 FR FR7419238A patent/FR2231977B1/fr not_active Expired
- 1974-06-04 GB GB2462174A patent/GB1462507A/en not_active Expired
- 1974-06-04 NL NL7407489A patent/NL7407489A/xx unknown
Also Published As
| Publication number | Publication date |
|---|---|
| GB1462507A (en) | 1977-01-26 |
| US3859525A (en) | 1975-01-07 |
| DE2426794A1 (de) | 1975-01-02 |
| FR2231977B1 (ja) | 1978-03-24 |
| NL7407489A (ja) | 1974-12-06 |
| FR2231977A1 (ja) | 1974-12-27 |
| CA994012A (en) | 1976-07-27 |
| ZA743510B (en) | 1975-05-28 |