JPS5018868B1 - - Google Patents

Info

Publication number
JPS5018868B1
JPS5018868B1 JP46043934A JP4393471A JPS5018868B1 JP S5018868 B1 JPS5018868 B1 JP S5018868B1 JP 46043934 A JP46043934 A JP 46043934A JP 4393471 A JP4393471 A JP 4393471A JP S5018868 B1 JPS5018868 B1 JP S5018868B1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP46043934A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP46043934A priority Critical patent/JPS5018868B1/ja
Publication of JPS5018868B1 publication Critical patent/JPS5018868B1/ja
Pending legal-status Critical Current

Links

Landscapes

  • Controlling Rewinding, Feeding, Winding, Or Abnormalities Of Webs (AREA)
  • Control Of Metal Rolling (AREA)
JP46043934A 1971-06-21 1971-06-21 Pending JPS5018868B1 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP46043934A JPS5018868B1 (ja) 1971-06-21 1971-06-21

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP46043934A JPS5018868B1 (ja) 1971-06-21 1971-06-21

Publications (1)

Publication Number Publication Date
JPS5018868B1 true JPS5018868B1 (ja) 1975-07-02

Family

ID=12677505

Family Applications (1)

Application Number Title Priority Date Filing Date
JP46043934A Pending JPS5018868B1 (ja) 1971-06-21 1971-06-21

Country Status (1)

Country Link
JP (1) JPS5018868B1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI503538B (zh) * 2013-03-29 2015-10-11 Hitachi High Tech Corp Defect inspection method and defect inspection device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI503538B (zh) * 2013-03-29 2015-10-11 Hitachi High Tech Corp Defect inspection method and defect inspection device

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