JPS50134738A - - Google Patents
Info
- Publication number
- JPS50134738A JPS50134738A JP49041009A JP4100974A JPS50134738A JP S50134738 A JPS50134738 A JP S50134738A JP 49041009 A JP49041009 A JP 49041009A JP 4100974 A JP4100974 A JP 4100974A JP S50134738 A JPS50134738 A JP S50134738A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Static Random-Access Memory (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP49041009A JPS50134738A (en) | 1974-04-15 | 1974-04-15 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP49041009A JPS50134738A (en) | 1974-04-15 | 1974-04-15 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS50134738A true JPS50134738A (en) | 1975-10-25 |
Family
ID=12596379
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP49041009A Pending JPS50134738A (en) | 1974-04-15 | 1974-04-15 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS50134738A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5589980A (en) * | 1978-11-27 | 1980-07-08 | Nec Corp | Semiconductor memory unit |
JP2006331511A (en) * | 2005-05-25 | 2006-12-07 | Matsushita Electric Ind Co Ltd | Semiconductor memory device and its testing procedures |
WO2011001562A1 (en) * | 2009-06-30 | 2011-01-06 | パナソニック株式会社 | Semiconductor integrated circuit |
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1974
- 1974-04-15 JP JP49041009A patent/JPS50134738A/ja active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5589980A (en) * | 1978-11-27 | 1980-07-08 | Nec Corp | Semiconductor memory unit |
JPS631676B2 (en) * | 1978-11-27 | 1988-01-13 | Nippon Electric Co | |
JP2006331511A (en) * | 2005-05-25 | 2006-12-07 | Matsushita Electric Ind Co Ltd | Semiconductor memory device and its testing procedures |
WO2011001562A1 (en) * | 2009-06-30 | 2011-01-06 | パナソニック株式会社 | Semiconductor integrated circuit |
US8451653B2 (en) | 2009-06-30 | 2013-05-28 | Panasonic Corporation | Semiconductor integrated circuit having a test function for detecting a defective cell |