JPS50134738A - - Google Patents
Info
- Publication number
- JPS50134738A JPS50134738A JP49041009A JP4100974A JPS50134738A JP S50134738 A JPS50134738 A JP S50134738A JP 49041009 A JP49041009 A JP 49041009A JP 4100974 A JP4100974 A JP 4100974A JP S50134738 A JPS50134738 A JP S50134738A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP49041009A JPS50134738A (de) | 1974-04-15 | 1974-04-15 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP49041009A JPS50134738A (de) | 1974-04-15 | 1974-04-15 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS50134738A true JPS50134738A (de) | 1975-10-25 |
Family
ID=12596379
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP49041009A Pending JPS50134738A (de) | 1974-04-15 | 1974-04-15 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS50134738A (de) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5589980A (en) * | 1978-11-27 | 1980-07-08 | Nec Corp | Semiconductor memory unit |
| JP2006331511A (ja) * | 2005-05-25 | 2006-12-07 | Matsushita Electric Ind Co Ltd | 半導体記憶装置およびその検査手法 |
| WO2011001562A1 (ja) * | 2009-06-30 | 2011-01-06 | パナソニック株式会社 | 半導体集積回路 |
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1974
- 1974-04-15 JP JP49041009A patent/JPS50134738A/ja active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5589980A (en) * | 1978-11-27 | 1980-07-08 | Nec Corp | Semiconductor memory unit |
| JPS631676B2 (de) * | 1978-11-27 | 1988-01-13 | Nippon Electric Co | |
| JP2006331511A (ja) * | 2005-05-25 | 2006-12-07 | Matsushita Electric Ind Co Ltd | 半導体記憶装置およびその検査手法 |
| WO2011001562A1 (ja) * | 2009-06-30 | 2011-01-06 | パナソニック株式会社 | 半導体集積回路 |
| US8451653B2 (en) | 2009-06-30 | 2013-05-28 | Panasonic Corporation | Semiconductor integrated circuit having a test function for detecting a defective cell |