JPS50120779A - - Google Patents

Info

Publication number
JPS50120779A
JPS50120779A JP49026319A JP2631974A JPS50120779A JP S50120779 A JPS50120779 A JP S50120779A JP 49026319 A JP49026319 A JP 49026319A JP 2631974 A JP2631974 A JP 2631974A JP S50120779 A JPS50120779 A JP S50120779A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP49026319A
Other languages
Japanese (ja)
Other versions
JPS5322033B2 (de
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2631974A priority Critical patent/JPS5322033B2/ja
Publication of JPS50120779A publication Critical patent/JPS50120779A/ja
Publication of JPS5322033B2 publication Critical patent/JPS5322033B2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
JP2631974A 1974-03-08 1974-03-08 Expired JPS5322033B2 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2631974A JPS5322033B2 (de) 1974-03-08 1974-03-08

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2631974A JPS5322033B2 (de) 1974-03-08 1974-03-08

Publications (2)

Publication Number Publication Date
JPS50120779A true JPS50120779A (de) 1975-09-22
JPS5322033B2 JPS5322033B2 (de) 1978-07-06

Family

ID=12190057

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2631974A Expired JPS5322033B2 (de) 1974-03-08 1974-03-08

Country Status (1)

Country Link
JP (1) JPS5322033B2 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6435926A (en) * 1987-07-30 1989-02-07 Tokyo Electron Ltd Reliability testing system for semiconductor element

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6435926A (en) * 1987-07-30 1989-02-07 Tokyo Electron Ltd Reliability testing system for semiconductor element

Also Published As

Publication number Publication date
JPS5322033B2 (de) 1978-07-06

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