JPS50110577A - - Google Patents

Info

Publication number
JPS50110577A
JPS50110577A JP1545574A JP1545574A JPS50110577A JP S50110577 A JPS50110577 A JP S50110577A JP 1545574 A JP1545574 A JP 1545574A JP 1545574 A JP1545574 A JP 1545574A JP S50110577 A JPS50110577 A JP S50110577A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1545574A
Other languages
Japanese (ja)
Other versions
JPS5223224B2 (en:Method
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1545574A priority Critical patent/JPS5223224B2/ja
Publication of JPS50110577A publication Critical patent/JPS50110577A/ja
Publication of JPS5223224B2 publication Critical patent/JPS5223224B2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP1545574A 1974-02-08 1974-02-08 Expired JPS5223224B2 (en:Method)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1545574A JPS5223224B2 (en:Method) 1974-02-08 1974-02-08

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1545574A JPS5223224B2 (en:Method) 1974-02-08 1974-02-08

Publications (2)

Publication Number Publication Date
JPS50110577A true JPS50110577A (en:Method) 1975-08-30
JPS5223224B2 JPS5223224B2 (en:Method) 1977-06-22

Family

ID=11889265

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1545574A Expired JPS5223224B2 (en:Method) 1974-02-08 1974-02-08

Country Status (1)

Country Link
JP (1) JPS5223224B2 (en:Method)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010019840A (ja) * 2008-07-11 2010-01-28 Advantest Corp 測定装置、試験装置および測定方法
JP2015090745A (ja) * 2013-11-05 2015-05-11 エスペック株式会社 外部短絡試験装置及び外部短絡試験方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010019840A (ja) * 2008-07-11 2010-01-28 Advantest Corp 測定装置、試験装置および測定方法
JP2015090745A (ja) * 2013-11-05 2015-05-11 エスペック株式会社 外部短絡試験装置及び外部短絡試験方法

Also Published As

Publication number Publication date
JPS5223224B2 (en:Method) 1977-06-22

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