JPS50110286A - - Google Patents

Info

Publication number
JPS50110286A
JPS50110286A JP1455974A JP1455974A JPS50110286A JP S50110286 A JPS50110286 A JP S50110286A JP 1455974 A JP1455974 A JP 1455974A JP 1455974 A JP1455974 A JP 1455974A JP S50110286 A JPS50110286 A JP S50110286A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1455974A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1455974A priority Critical patent/JPS50110286A/ja
Publication of JPS50110286A publication Critical patent/JPS50110286A/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1455974A 1974-02-06 1974-02-06 Pending JPS50110286A (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1455974A JPS50110286A (zh) 1974-02-06 1974-02-06

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1455974A JPS50110286A (zh) 1974-02-06 1974-02-06

Publications (1)

Publication Number Publication Date
JPS50110286A true JPS50110286A (zh) 1975-08-30

Family

ID=11864496

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1455974A Pending JPS50110286A (zh) 1974-02-06 1974-02-06

Country Status (1)

Country Link
JP (1) JPS50110286A (zh)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53112675A (en) * 1977-03-14 1978-10-02 Mitsubishi Electric Corp Discriminator for waveform
JPS5513588A (en) * 1978-07-17 1980-01-30 Nec Corp Sampling circuit
JPS5868679A (ja) * 1981-10-19 1983-04-23 Mitsubishi Electric Corp 半導体素子の特性測定方法
JPH0588147U (ja) * 1992-05-06 1993-11-26 デイエツクスアンテナ株式会社 動作電源判定装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4828176A (zh) * 1971-08-16 1973-04-13

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4828176A (zh) * 1971-08-16 1973-04-13

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53112675A (en) * 1977-03-14 1978-10-02 Mitsubishi Electric Corp Discriminator for waveform
JPS5412393B2 (zh) * 1977-03-14 1979-05-22
JPS5513588A (en) * 1978-07-17 1980-01-30 Nec Corp Sampling circuit
JPS5868679A (ja) * 1981-10-19 1983-04-23 Mitsubishi Electric Corp 半導体素子の特性測定方法
JPH0125429B2 (zh) * 1981-10-19 1989-05-17 Mitsubishi Electric Corp
JPH0588147U (ja) * 1992-05-06 1993-11-26 デイエツクスアンテナ株式会社 動作電源判定装置

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