JPS50103270A - - Google Patents

Info

Publication number
JPS50103270A
JPS50103270A JP588474A JP588474A JPS50103270A JP S50103270 A JPS50103270 A JP S50103270A JP 588474 A JP588474 A JP 588474A JP 588474 A JP588474 A JP 588474A JP S50103270 A JPS50103270 A JP S50103270A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP588474A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP588474A priority Critical patent/JPS50103270A/ja
Publication of JPS50103270A publication Critical patent/JPS50103270A/ja
Pending legal-status Critical Current

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Landscapes

  • Led Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP588474A 1974-01-11 1974-01-11 Pending JPS50103270A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP588474A JPS50103270A (ja) 1974-01-11 1974-01-11

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP588474A JPS50103270A (ja) 1974-01-11 1974-01-11

Publications (1)

Publication Number Publication Date
JPS50103270A true JPS50103270A (ja) 1975-08-15

Family

ID=11623314

Family Applications (1)

Application Number Title Priority Date Filing Date
JP588474A Pending JPS50103270A (ja) 1974-01-11 1974-01-11

Country Status (1)

Country Link
JP (1) JPS50103270A (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020197430A (ja) * 2019-05-31 2020-12-10 株式会社アドバンテスト 試験装置、試験方法およびプログラム
US11788885B2 (en) 2021-02-26 2023-10-17 Advantest Corporation Test apparatus, test method, and computer-readable storage medium
US11800619B2 (en) 2021-01-21 2023-10-24 Advantest Corporation Test apparatus, test method, and computer-readable storage medium

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020197430A (ja) * 2019-05-31 2020-12-10 株式会社アドバンテスト 試験装置、試験方法およびプログラム
US11800619B2 (en) 2021-01-21 2023-10-24 Advantest Corporation Test apparatus, test method, and computer-readable storage medium
US11788885B2 (en) 2021-02-26 2023-10-17 Advantest Corporation Test apparatus, test method, and computer-readable storage medium

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