JPS50102385A - - Google Patents

Info

Publication number
JPS50102385A
JPS50102385A JP49005889A JP588974A JPS50102385A JP S50102385 A JPS50102385 A JP S50102385A JP 49005889 A JP49005889 A JP 49005889A JP 588974 A JP588974 A JP 588974A JP S50102385 A JPS50102385 A JP S50102385A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP49005889A
Other languages
Japanese (ja)
Other versions
JPS5760571B2 (xx
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP49005889A priority Critical patent/JPS5760571B2/ja
Publication of JPS50102385A publication Critical patent/JPS50102385A/ja
Publication of JPS5760571B2 publication Critical patent/JPS5760571B2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
JP49005889A 1974-01-11 1974-01-11 Expired JPS5760571B2 (xx)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP49005889A JPS5760571B2 (xx) 1974-01-11 1974-01-11

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP49005889A JPS5760571B2 (xx) 1974-01-11 1974-01-11

Publications (2)

Publication Number Publication Date
JPS50102385A true JPS50102385A (xx) 1975-08-13
JPS5760571B2 JPS5760571B2 (xx) 1982-12-20

Family

ID=11623447

Family Applications (1)

Application Number Title Priority Date Filing Date
JP49005889A Expired JPS5760571B2 (xx) 1974-01-11 1974-01-11

Country Status (1)

Country Link
JP (1) JPS5760571B2 (xx)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015052561A (ja) * 2013-09-09 2015-03-19 富士通株式会社 二次イオン質量分析装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015052561A (ja) * 2013-09-09 2015-03-19 富士通株式会社 二次イオン質量分析装置

Also Published As

Publication number Publication date
JPS5760571B2 (xx) 1982-12-20

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